dblp.uni-trier.dewww.dagstuhl.dewww.uni-trier.de

Hans L. Hartnagel Coauthor index pubzone.org

List of publications from the DBLP Bibliography Server - FAQ
Ask others: ACM DL/Guide - CiteSeerX - CSB - MetaPress - Google - Bing - Yahoo

DBLP keys2008
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJochen Sigmund, Jean-François Lampin, Valentin Ivannikov, Cezary Sydlo, Michail Feiginov, Dimitris Pavlidis, Peter Meissner, Hans L. Hartnagel: Low-Temperature Grown GaAsSb with Sub-Picosecond Photocarrier Lifetime for Continuous-Wave Terahertz Measurements. IEICE Transactions 91-C(7): 1058-1062 (2008)
2005
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLCezary Sydlo, Jochen Sigmund, Bastian Mottet, Hans L. Hartnagel: Reliability investigations on LTG-GaAs photomixers for THz generation based on optical heterodyning. Microelectronics Reliability 45(9-11): 1600-1604 (2005)
2004
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLStephan Biber, Oleg Cojocari, Günther Rehm, Bastian Mottet, Manuel Rodríguez-Gironés, Lorenz-Peter Schmidt, Hans L. Hartnagel: A novel system for systematic microwave noise and DC characterization of terahertz Schottky diodes. IEEE T. Instrumentation and Measurement 53(2): 581-587 (2004)
2003
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLCezary Sydlo, K. Mutamba, L. Divac Krnic, Bastian Mottet, Hans L. Hartnagel: Reliability studies on integrated GaAs power-sensor structures using pulsed electrical stress. Microelectronics Reliability 43(9-11): 1929-1933 (2003)
2002
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLCezary Sydlo, M. Saglam, Bastian Mottet, Manuel Rodríguez-Gironés, Hans L. Hartnagel: Reliability investigations on HBV using pulsed electrical stress. Microelectronics Reliability 42(9-11): 1563-1568 (2002)
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLV. Ichizli, Manuel Rodríguez-Gironés, L. Marchand, C. Garden, Oleg Cojocari, Bastian Mottet, Hans L. Hartnagel: Process Control and Failure Analysis Implementation for THz Schottky-based components. Microelectronics Reliability 42(9-11): 1593-1596 (2002)
2001
3no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLCezary Sydlo, Bastian Mottet, Husin Ganis, Hans L. Hartnagel, Viktor Krozer, S. L. Delage, Simone Cassette, Eric Chartier, D. Floriot, Steven Bland: Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT. Microelectronics Reliability 41(9-10): 1567-1571 (2001)
1996
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLLutz J. Micheel, Hans L. Hartnagel: Interband RTDs with Nanoelectronic HBT-LED Structures for Multiple-Valued Computation. ISMVL 1996: 80-85
1994
1no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLLutz J. Micheel, Hans L. Hartnagel, Wallace T. Anderson, Stephen W. Kirchoefer, Nicolas A. Papanicolaou: Interband-Tunneling III-V Semiconductor Structures for Multiple-Valued Literal and Arithmetic Functions. ISMVL 1994: 198-206

Coauthor Index

1Wallace T. Anderson [1]
2Stephan Biber [7]
3Steven Bland [3]
4Simone Cassette [3]
5Eric Chartier [3]
6Oleg Cojocari [4] [7]
7S. L. Delage [3]
8Michail Feiginov [9]
9D. Floriot [3]
10Husin Ganis [3]
11C. Garden [4]
12V. Ichizli [4]
13Valentin Ivannikov [9]
14Stephen W. Kirchoefer [1]
15L. Divac Krnic [6]
16Viktor Krozer [3]
17Jean-François Lampin [9]
18L. Marchand [4]
19Peter Meissner [9]
20Lutz J. Micheel [1] [2]
21Bastian Mottet [3] [4] [5] [6] [7] [8]
22K. Mutamba [6]
23Nicolas A. Papanicolaou [1]
24Dimitris Pavlidis [9]
25Günther Rehm [7]
26Manuel Rodríguez-Gironés [4] [5] [7]
27M. Saglam [5]
28Lorenz-Peter Schmidt [7]
29Jochen Sigmund [8] [9]
30Cezary Sydlo [3] [5] [6] [8] [9]

Colors in the list of coauthors

Last update Thu May 31 18:55:10 2012 CET by the DBLP TeamThis material is Open Data Data released under the ODC-BY 1.0 license — See also our legal information page