 | 2010 |
|---|
| 7 |       | C. Hartmann,
M. Wieberneit:
Investigation on BIST assisted failure analysis on digital integrated circuits.
Microelectronics Reliability 50(9-11): 1464-1468 (2010) |
| 2009 |
|---|
| 6 | | C. Hartmann,
M. Wieberneit:
Investigation on marginal failure characteristics and related defects analysed by soft defect localization.
Microelectronics Reliability 49(9-11): 1137-1142 (2009) |
| 2008 |
|---|
| 5 | | C. Hartmann,
M. Wieberneit:
Layout analysis as supporting tool for failure localization: Basic principles and case studies.
Microelectronics Reliability 48(8-9): 1343-1348 (2008) |
| 2005 |
|---|
| 4 | | C. Hartmann:
CAC and blocking capacity of multi-service smart antenna CDMA systems with and without code re-use.
IPCCC 2005: 423-429 |
| 3 | | Dan Avidor,
C. Hartmann,
Sayandev Mukherjee:
On the uplink SIR of a mobile in soft handoff with applications to BLER estimation.
IEEE Transactions on Wireless Communications 4(2): 467-474 (2005) |
| 2 | | C. Hartmann,
W. Mertin,
G. Bacher:
Circuit-internal signal measurements with a needle sensor.
Microelectronics Reliability 45(9-11): 1505-1508 (2005) |
| 2002 |
|---|
| 1 | | C. Hartmann,
R. Weber,
W. Mertin,
E. Kubalek,
A.-D. Müller,
M. Hietschold:
Simultaneous IC-internal voltage and current measurements via a multi lever Scanning Force Microscope.
Microelectronics Reliability 42(9-11): 1759-1762 (2002) |
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