| | |
- CSB - MetaPress - Google - Bing - Yahoo
 | 2008 | |
|---|---|---|
| 4 |      | Csaba Dominkovics, Gábor Harsányi: Fractal description of dendrite growth during electrochemical migration. Microelectronics Reliability 48(10): 1628-1634 (2008) |
| 3 | | Balázs Illés, Gábor Harsányi: 3D thermal model to investigate component displacement phenomenon during reflow soldering. Microelectronics Reliability 48(7): 1062-1068 (2008) |
| 2002 | ||
| 2 | | P. Bojta, P. Németh, Gábor Harsányi: Searching for appropriate humidity accelerated migration reliability tests methods. Microelectronics Reliability 42(8): 1213-1218 (2002) |
| 2001 | ||
| 1 | | Gábor Harsányi, George Inzelt: Comparing migratory resistive short formation abilities of conductor systems applied in advanced interconnection systems. Microelectronics Reliability 41(2): 229-237 (2001) |
| 1 | P. Bojta | [2] |
| 2 | Csaba Dominkovics | [4] |
| 3 | Balázs Illés | [3] |
| 4 | George Inzelt | [1] |
| 5 | P. Németh | [2] |
Colors in the list of coauthors
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