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Peter Harrod Coauthor index pubzone.org

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11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLS. Saqib Khursheed, Bashir M. Al-Hashimi, Krishnendu Chakrabarty, Peter Harrod: Gate-Sizing-Based Single Vdd Test for Bridge Defects in Multivoltage Designs. IEEE Trans. on CAD of Integrated Circuits and Systems 29(9): 1409-1421 (2010)
2009
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLS. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod: Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing. DATE 2009: 1349-1354
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLS. Saqib Khursheed, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod: Diagnosis of Multiple-Voltage Design With Bridge Defect. IEEE Trans. on CAD of Integrated Circuits and Systems 28(3): 406-416 (2009)
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLUrban Ingelsson, Bashir M. Al-Hashimi, S. Saqib Khursheed, Sudhakar M. Reddy, Peter Harrod: Process Variation-Aware Test for Resistive Bridges. IEEE Trans. on CAD of Integrated Circuits and Systems 28(8): 1269-1274 (2009)
2008
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLS. Saqib Khursheed, Paul M. Rosinger, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod: Bridge Defect Diagnosis for Multiple-Voltage Design. European Test Symposium 2008: 99-104
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAshish Darbari, Bashir M. Al-Hashimi, Peter Harrod, Daryl Bradley: A New Approach for Transient Fault Injection Using Symbolic Simulation. IOLTS 2008: 93-98
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLS. Saqib Khursheed, Urban Ingelsson, Paul M. Rosinger, Bashir M. Al-Hashimi, Peter Harrod: Bridging Fault Test Method With Adaptive Power Management Awareness. IEEE Trans. on CAD of Integrated Circuits and Systems 27(6): 1117-1127 (2008)
2006
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLNoohul Basheer Zain Ali, Mark Zwolinski, Bashir M. Al-Hashimi, Peter Harrod: Dynamic Voltage Scaling Aware Delay Fault Testing. European Test Symposium 2006: 15-20
2003
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMichael G. Wahl, Sudipta Bhawmik, Kamran Zarrineh, Pradipta Ghosh, Scott Davidson, Peter Harrod: The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data. ITC 2003: 998-1007
1999
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Harrod: Testing reusable IP-a case study. ITC 1999: 493-498
1no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRobin Saxby, Peter Harrod: Test in the Emerging Intellectual Property Business. IEEE Design & Test of Computers 16(1): 16-18 (1999)

Coauthor Index

1Bashir M. Al-Hashimi [4] [5] [6] [7] [8] [9] [10] [11]
2Noohul Basheer Zain Ali [4]
3Sudipta Bhawmik [3]
4Daryl Bradley [6]
5Krishnendu Chakrabarty [11]
6Ashish Darbari [6]
7Scott Davidson [3]
8Pradipta Ghosh [3]
9Urban Ingelsson [5] [8]
10S. Saqib Khursheed [5] [7] [8] [9] [10] [11]
11Sudhakar M. Reddy [7] [8] [9]
12Paul M. Rosinger [5] [7]
13Robin Saxby [1]
14Michael G. Wahl [3]
15Kamran Zarrineh [3]
16Mark Zwolinski [4]

Colors in the list of coauthors

Last update Thu May 31 18:55:10 2012 CET by the DBLP TeamThis material is Open Data Data released under the ODC-BY 1.0 license — See also our legal information page