 | 2011 |
| 33 |  | Sharon Barner,
Ian G. Harris,
Daniel Kroening,
Orna Raz:
Hardware and Software: Verification and Testing - 6th International Haifa Verification Conference, HVC 2010, Haifa, Israel, October 4-7, 2010. Revised Selected Papers
Springer 2011 |
| 2007 |
| 32 |  | Shireesh Verma,
Ian G. Harris,
Kiran Ramineni:
Interactive presentation: Automatic generation of functional coverage models from behavioral verilog descriptions.
DATE 2007: 900-905 |
| 31 |  | Franco Fummi,
Cristina Marconcini,
Graziano Pravadelli,
Ian G. Harris:
A CLP-Based Functional ATPG for Extended FSMs.
MTV 2007: 98-105 |
| 2006 |
| 30 |  | Ian G. Harris:
A coverage metric for the validation of interacting processes.
DATE 2006: 1019-1024 |
| 29 |  | Ian G. Harris:
Guest Editor's Introduction to the Special Section on Simulation-Based Design Validation.
IEEE Trans. Computers 55(11): 1313-1314 (2006) |
| 28 |  | Ian G. Harris,
Franco Fummi:
Guest Editor's Introduction.
International Journal of Parallel Programming 34(1): 1-2 (2006) |
| 2005 |
| 27 |  | Shireesh Verma,
Kiran Ramineni,
Ian G. Harris:
An efficient control-oriented coverage metric.
ASP-DAC 2005: 317-322 |
| 26 |  | Ian G. Harris:
Introduction.
ACM Trans. Design Autom. Electr. Syst. 10(4): 587-588 (2005) |
| 25 |  | Matthew W. Heath,
Wayne P. Burleson,
Ian G. Harris:
Synchro-Tokens: A Deterministic GALS Methodology for Chip-Level Debug and Test.
IEEE Trans. Computers 54(12): 1532-1546 (2005) |
| 24 |  | Franco Fummi,
Ian G. Harris:
Editorial.
International Journal of Parallel Programming 33(6): 583-584 (2005) |
| 2004 |
| 23 |  | Matthew W. Heath,
Wayne P. Burleson,
Ian G. Harris:
Synchro-Tokens: Eliminating Nondeterminism to Enable Chip-Level Test of Globally-Asynchronous Locally-Synchronous SoC?s.
DATE 2004: 410-415 |
| 22 |  | Carol Stolicny,
Tapio Koivukangas,
Rubin A. Parekhji,
Ian G. Harris,
Rob Aitken:
ITC 2003 panels: Part 1.
IEEE Design & Test of Computers 21(2): 160-163 (2004) |
| 2003 |
| 21 |  | Zhihong Zeng,
Qiushuang Zhang,
Ian G. Harris,
Maciej J. Ciesielski:
Fast Computation of Data Correlation Using BDDs.
DATE 2003: 10122-10129 |
| 20 |  | Dereck A. Fernandes,
Ian G. Harris:
Application of Built in Self-Test for Interconnect Testing of FPGAs.
ITC 2003: 1248-1257 |
| 19 |  | Ian G. Harris:
The Confluence of Manufacturing Test and Design Validation.
ITC 2003: 1290 |
| 18 |  | Matthew W. Heath,
Ian G. Harris:
A Deterministic Globally Asynchronous Locally Synchronousy Microprocessor Architecture.
MTV 2003: 119- |
| 17 |  | Ian G. Harris:
Fault Models and Test Generation for Hardware-Software Covalidation.
IEEE Design & Test of Computers 20(4): 40-47 (2003) |
| 16 |  | Qiushuang Zhang,
Ian G. Harris:
Partial BIST insertion to eliminate data correlation.
IEEE Trans. on CAD of Integrated Circuits and Systems 22(3): 374-379 (2003) |
| 15 |  | Srikanth Arekapudi,
Fei Xin,
Jinzheng Peng,
Ian G. Harris:
ATPG for Timing Errors in Globally Asynchronous Locally Synchronous Systems.
Journal of Circuits, Systems, and Computers 12(3): 305-332 (2003) |
| 2002 |
| 14 |  | Ian G. Harris,
Russell Tessier:
Testing and diagnosis of interconnect faults in cluster-based FPGA architectures.
IEEE Trans. on CAD of Integrated Circuits and Systems 21(11): 1337-1343 (2002) |
| 2001 |
| 13 |  | Qiushuang Zhang,
Ian G. Harris:
A validation fault model for timing-induced functional errors.
ITC 2001: 813-820 |
| 12 |  | Ian G. Harris,
Premachandran R. Menon,
Russell Tessier:
BIST-based delay path testing in FPGA architectures.
ITC 2001: 932-938 |
| 2000 |
| 11 |  | Ian G. Harris,
Russell Tessier:
Interconnect testing in cluster-based FPGA architectures.
DAC 2000: 49-54 |
| 10 |  | Qiushuang Zhang,
Ian G. Harris:
A Data Flow Fault Coverage Metric for Validation of Behavioral HDL Descriptions.
ICCAD 2000: 369-372 |
| 9 |  | Ian G. Harris,
Russell Tessier:
Diagnosis of Interconnect Faults in Cluster-Based FPGA Architectures.
ICCAD 2000: 472-475 |
| 8 |  | Qiushuang Zhang,
Ian G. Harris:
A domain coverage metric for the validation of behavioral VHDL descriptions.
ITC 2000: 302-308 |
| 1999 |
| 7 |  | Qiushuang Zhang,
Ian G. Harris:
Partial BIST insertion to eliminate data correlation.
ICCAD 1999: 395-399 |
| 1994 |
| 6 |  | Ian G. Harris,
Alex Orailoglu:
Microarchitectural Synthesis of VLSI Designs with High Test Concurrency.
DAC 1994: 206-211 |
| 5 |  | Ian G. Harris,
Alex Orailoglu:
Fine-Grained Concurrency in Test Scheduling for Partial-Intrusion BIST.
EDAC-ETC-EUROASIC 1994: 119-123 |
| 4 |  | Ian G. Harris,
Alex Orailoglu:
SYNCBIST: SYNthesis for Concurrent Built-In-Self-Testability.
ICCD 1994: 101-104 |
| 1993 |
| 3 |  | Alex Orailoglu,
Ian G. Harris:
Test Path Generation and Test Scheduling for Self-Testable Designs.
ICCD 1993: 528-531 |
| 2 |  | Ian G. Harris,
Alex Orailoglu:
Intertwined Scheduling, Module Selection and Allocation in Time-and-Area.
ISCAS 1993: 1682-1685 |
| 1991 |
| 1 |  | P. Venkat Rangan,
Walter A. Burkhard,
Robert W. Rowdidge,
Harrick M. Vin,
John W. Lindwall,
Kashun Chan,
Ingvar A. Aaberg,
Linda M. Yamamoto,
Ian G. Harris:
A Testbed for Managing Digital Video and Audio Storage.
USENIX Summer 1991: 199-208 |