Kim Harper

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1997

1 Minh Quach, Kim Harper: Real-Time In-situ Monitoring and Characterization of Production Wafer Probing Process. ITC 1997: 802-808

	1997
1		Minh Quach, Kim Harper: Real-Time In-situ Monitoring and Characterization of Production Wafer Probing Process. ITC 1997: 802-808

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