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Friedrich Hapke Coauthor index pubzone.org

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DBLP keys2012
17Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLErik Jan Marinissen, Gilbert Vandling, Sandeep Kumar Goel, Friedrich Hapke, Jason Rivers, Nikolaus Mittermaier, Swapnil Bahl: EDA solutions to new-defect detection in advanced process technologies. DATE 2012: 123-128
2011
16Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLFriedrich Hapke, Jürgen Schlöffel, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, M. Reese, J. Rearick, Jason Rivers: Cell-aware analysis for small-delay effects and production test results from different fault models. ITC 2011: 1-8
2010
15Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLFriedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger: Defect-oriented cell-internal testing. ITC 2010: 285-294
14Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLStephan Eggersglüß, Görschwin Fey, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Rolf Drechsler: MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics. J. Electronic Testing 26(3): 307-322 (2010)
2009
13Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLFriedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson: Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. ITC 2009: 1-10
12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAbdul Wahid Hakmi, Stefan Holst, Hans-Joachim Wunderlich, Jürgen Schlöffel, Friedrich Hapke, Andreas Glowatz: Restrict Encoding for Mixed-Mode BIST. VTS 2009: 179-184
2008
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Daniel Tille: On Acceleration of SAT-Based ATPG for Industrial Designs. IEEE Trans. on CAD of Integrated Circuits and Systems 27(7): 1329-1333 (2008)
2007
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLStephan Eggersglüß, Daniel Tille, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel: Experimental Studies on SAT-Based ATPG for Gate Delay Faults. ISMVL 2007: 6
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJeroen Geuzebroek, Erik Jan Marinissen, Ananta K. Majhi, Andreas Glowatz, Friedrich Hapke: Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects. ITC 2007: 1-10
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAbdul Wahid Hakmi, Hans-Joachim Wunderlich, Christian G. Zoellin, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Laurent Souef: Programmable deterministic Built-In Self-Test. ITC 2007: 1-9
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLStephan Eggersglüß, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel: Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults. MEMOCODE 2007: 181-187
2006
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHarald P. E. Vranken, Sandeep Kumar Goel, Andreas Glowatz, Jürgen Schlöffel, Friedrich Hapke: Fault detection and diagnosis with parity trees for space compaction of test responses. DAC 2006: 1095-1098
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYuyi Tang, Hans-Joachim Wunderlich, Piet Engelke, Ilia Polian, Bernd Becker, Jürgen Schlöffel, Friedrich Hapke, Michael Wittke: X-masking during logic BIST and its impact on defect coverage. IEEE Trans. VLSI Syst. 14(2): 193-202 (2006)
2005
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJunhao Shi, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel: PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits. ISVLSI 2005: 212-217
2004
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker: X-Masking During Logic BIST and Its Impact on Defect Coverage. ITC 2004: 442-451
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLValentin Gherman, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Michael Garbers: Efficient Pattern Mapping for Deterministic Logic BIST. ITC 2004: 48-56
2003
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHarald P. E. Vranken, Friedrich Hapke, Soenke Rogge, Domenico Chindamo, Erik H. Volkerink: ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume. ITC 2003: 1069-1078

Coauthor Index

1Dan Adolfsson [13]
2Swapnil Bahl [17]
3Bernd Becker [3] [5]
4Domenico Chindamo [1]
5Rolf Drechsler [4] [7] [10] [11] [14]
6Stephan Eggersglüß [7] [10] [11] [14]
7Stefan Eichenberger [13] [15]
8Piet Engelke [3] [5]
9Görschwin Fey [4] [7] [10] [11] [14]
10Michael Garbers [2]
11Jeroen Geuzebroek [9]
12Valentin Gherman [2]
13Andreas Glowatz [4] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16]
14Sandeep Kumar Goel [6] [17]
15Abdul Wahid Hakmi [8] [12]
16Hamidreza Hashempour [13] [15]
17Stefan Holst [12]
18Camelia Hora [13]
19Rene Krenz-Baath [13] [15]
20Ananta K. Majhi [9]
21Erik Jan Marinissen [9] [17]
22Nikolaus Mittermaier [17]
23Ilia Polian [3] [5]
24Janusz Rajski [16]
25J. Rearick [16]
26Wilfried Redemund [15] [16]
27M. Reese [16]
28Jason Rivers [16] [17]
29Soenke Rogge [1]
30Jürgen Schlöffel [4] [5] [6] [7] [8] [10] [11] [12] [13] [14] [15] [16]
31Junhao Shi [4]
32Laurent Souef [8]
33Yuyi Tang [3] [5]
34Daniel Tille [10] [11]
35Gilbert Vandling [17]
36Erik H. Volkerink [1]
37Harald P. E. Vranken [1] [2] [3] [6]
38Michael Wittke [2] [3] [5] [15]
39Hans-Joachim Wunderlich [2] [3] [5] [8] [12]
40Christian G. Zoellin [8]

Last update Thu May 31 18:55:10 2012 CET by the DBLP TeamThis material is Open Data Data released under the ODC-BY 1.0 license — See also our legal information page