 | 2012 |
| 17 |  | Erik Jan Marinissen,
Gilbert Vandling,
Sandeep Kumar Goel,
Friedrich Hapke,
Jason Rivers,
Nikolaus Mittermaier,
Swapnil Bahl:
EDA solutions to new-defect detection in advanced process technologies.
DATE 2012: 123-128 |
| 2011 |
| 16 |  | Friedrich Hapke,
Jürgen Schlöffel,
Wilfried Redemund,
Andreas Glowatz,
Janusz Rajski,
M. Reese,
J. Rearick,
Jason Rivers:
Cell-aware analysis for small-delay effects and production test results from different fault models.
ITC 2011: 1-8 |
| 2010 |
| 15 |  | Friedrich Hapke,
Wilfried Redemund,
Jürgen Schlöffel,
Rene Krenz-Baath,
Andreas Glowatz,
Michael Wittke,
Hamidreza Hashempour,
Stefan Eichenberger:
Defect-oriented cell-internal testing.
ITC 2010: 285-294 |
| 14 |  | Stephan Eggersglüß,
Görschwin Fey,
Andreas Glowatz,
Friedrich Hapke,
Jürgen Schlöffel,
Rolf Drechsler:
MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics.
J. Electronic Testing 26(3): 307-322 (2010) |
| 2009 |
| 13 |  | Friedrich Hapke,
Rene Krenz-Baath,
Andreas Glowatz,
Jürgen Schlöffel,
Hamidreza Hashempour,
Stefan Eichenberger,
Camelia Hora,
Dan Adolfsson:
Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs.
ITC 2009: 1-10 |
| 12 |  | Abdul Wahid Hakmi,
Stefan Holst,
Hans-Joachim Wunderlich,
Jürgen Schlöffel,
Friedrich Hapke,
Andreas Glowatz:
Restrict Encoding for Mixed-Mode BIST.
VTS 2009: 179-184 |
| 2008 |
| 11 |  | Rolf Drechsler,
Stephan Eggersglüß,
Görschwin Fey,
Andreas Glowatz,
Friedrich Hapke,
Jürgen Schlöffel,
Daniel Tille:
On Acceleration of SAT-Based ATPG for Industrial Designs.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(7): 1329-1333 (2008) |
| 2007 |
| 10 |  | Stephan Eggersglüß,
Daniel Tille,
Görschwin Fey,
Rolf Drechsler,
Andreas Glowatz,
Friedrich Hapke,
Jürgen Schlöffel:
Experimental Studies on SAT-Based ATPG for Gate Delay Faults.
ISMVL 2007: 6 |
| 9 |  | Jeroen Geuzebroek,
Erik Jan Marinissen,
Ananta K. Majhi,
Andreas Glowatz,
Friedrich Hapke:
Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects.
ITC 2007: 1-10 |
| 8 |  | Abdul Wahid Hakmi,
Hans-Joachim Wunderlich,
Christian G. Zoellin,
Andreas Glowatz,
Friedrich Hapke,
Jürgen Schlöffel,
Laurent Souef:
Programmable deterministic Built-In Self-Test.
ITC 2007: 1-9 |
| 7 |  | Stephan Eggersglüß,
Görschwin Fey,
Rolf Drechsler,
Andreas Glowatz,
Friedrich Hapke,
Jürgen Schlöffel:
Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults.
MEMOCODE 2007: 181-187 |
| 2006 |
| 6 |  | Harald P. E. Vranken,
Sandeep Kumar Goel,
Andreas Glowatz,
Jürgen Schlöffel,
Friedrich Hapke:
Fault detection and diagnosis with parity trees for space compaction of test responses.
DAC 2006: 1095-1098 |
| 5 |  | Yuyi Tang,
Hans-Joachim Wunderlich,
Piet Engelke,
Ilia Polian,
Bernd Becker,
Jürgen Schlöffel,
Friedrich Hapke,
Michael Wittke:
X-masking during logic BIST and its impact on defect coverage.
IEEE Trans. VLSI Syst. 14(2): 193-202 (2006) |
| 2005 |
| 4 |  | Junhao Shi,
Görschwin Fey,
Rolf Drechsler,
Andreas Glowatz,
Friedrich Hapke,
Jürgen Schlöffel:
PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits.
ISVLSI 2005: 212-217 |
| 2004 |
| 3 |  | Yuyi Tang,
Hans-Joachim Wunderlich,
Harald P. E. Vranken,
Friedrich Hapke,
Michael Wittke,
Piet Engelke,
Ilia Polian,
Bernd Becker:
X-Masking During Logic BIST and Its Impact on Defect Coverage.
ITC 2004: 442-451 |
| 2 |  | Valentin Gherman,
Hans-Joachim Wunderlich,
Harald P. E. Vranken,
Friedrich Hapke,
Michael Wittke,
Michael Garbers:
Efficient Pattern Mapping for Deterministic Logic BIST.
ITC 2004: 48-56 |
| 2003 |
| 1 |  | Harald P. E. Vranken,
Friedrich Hapke,
Soenke Rogge,
Domenico Chindamo,
Erik H. Volkerink:
ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume.
ITC 2003: 1069-1078 |