Patrick R. Hansen

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1998

2 R. Dean Adams, Edmond S. Cooley, Patrick R. Hansen: Quad DCVS dynamic logic fault modeling and testing. ITC 1998: 356-362

1997

1 R. Dean Adams, Edmond S. Cooley, Patrick R. Hansen: A Self-Test Circuit for Evaluating Memory Sense-Amplifier Signal. ITC 1997: 217-225

	1998
2		R. Dean Adams, Edmond S. Cooley, Patrick R. Hansen: Quad DCVS dynamic logic fault modeling and testing. ITC 1998: 356-362
	1997
1		R. Dean Adams, Edmond S. Cooley, Patrick R. Hansen: A Self-Test Circuit for Evaluating Memory Sense-Amplifier Signal. ITC 1997: 217-225

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