Jari Hannu

	2010
2		Jari Hannu, Teuvo Saikkonen, Juha Häkkinen, Juha Karttunen, Markku Moilanen: Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture. J. Electronic Testing 26(6): 641-658 (2010)
	2007
1		Jari Hannu, Markku Moilanen: Methods of Testing Discrete Semiconductors in the 1149.4 Environment. J. Electronic Testing 23(6): 581-592 (2007)

Coauthor Index

1	Juha Häkkinen	[2]
2	Juha Karttunen	[2]
3	Markku Moilanen	[1] [2]
4	Teuvo Saikkonen	[2]

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