Donghoon Han

	2010
11		Donghoon Han, N. Balakrishnan: Inference for a simple step-stress model with competing risks for failure from the exponential distribution under time constraint. Computational Statistics & Data Analysis 54(9): 2066-2081 (2010)
10		Donghoon Han, Byung-Sung Kim, Abhijit Chatterjee: DSP-Driven Self-Tuning of RF Circuits for Process-Induced Performance Variability. IEEE Trans. VLSI Syst. 18(2): 305-314 (2010)
	2009
9		Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan: Iterative built-in testing and tuning of mixed-signal/RF systems. ICCD 2009: 319-326
	2008
8		Rajarajan Senguttuvan, Hyun Choi, Donghoon Han, Abhijit Chatterjee: Built-in Test of Frequency Modulated RF Transmitters Using Embedded Low-Pass Filters. European Test Symposium 2008: 41-46
	2007
7		Hyun Choi, Donghoon Han, Abhijit Chatterjee: Enhanced Resolution Jitter Testing Using Jitter Expansion. VTS 2007: 104-109
6		Donghoon Han, Soumendu Bhattacharya, Abhijit Chatterjee: Low-cost parametric test and diagnosis of RF systems using multi-tone response envelope detection. IET Computers & Digital Techniques 1(3): 170-179 (2007)
	2006
5		Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee: Low Cost Parametric Failure Diagnosis of RF Transceivers. European Test Symposium 2006: 205-212
	2005
4		Donghoon Han, Abhijit Chatterjee: Robust Built-In Test of RF ICs Using Envelope Detectors. Asian Test Symposium 2005: 2-7
3		Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt: On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). IOLTS 2005: 106-111
	2004
2		Donghoon Han, Abhijit Chatterjee: Device Resizing Based Optimization of Analog Circuits for Reduced Test Cost: Cost Metric and Case Study. Asian Test Symposium 2004: 420-425
1		Donghoon Han, Abhijit Chatterjee: Simulation-in-the-Loop Analog Circuit Sizing Method using Adaptive Model-based Simulated Annealing. IWSOC 2004: 127-130

Coauthor Index

1	Selim Sermet Akbay	[3]
2	N. Balakrishnan	[11]
3	Soumendu Bhattacharya	[3] [5] [6] [9]
4	Abhijit Chatterjee	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10]
5	Hyun Choi	[7] [8] [9]
6	Shyam Kumar Devarakond	[9]
7	William R. Eisenstadt	[3]
8	Abhilash Goyal	[9]
9	Shalabh Goyal	[5]
10	Byung-Sung Kim	[10]
11	Deuk Lee	[9]
12	Vishwanath Natarajan	[9]
13	Shreyas Sen	[9]
14	Rajarajan Senguttuvan	[8] [9]
15	Madhavan Swaminathan	[9]

Colors in the list of coauthors

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