Yuichi Hamamura

	2011
3		Chizu Matsumoto, Yuichi Hamamura, Yoshiyuki Tsunoda, Hiroshi Uozaki, Isao Miyazaki, Shiro Kamohara, Yoshiyuki Kaneko, Kenji Kanamitsu: A New Critical Area Simulation Algorithm and Its Application for Failing Bit Analysis. IEICE Transactions 94-C(3): 353-360 (2011)
	2009
2		Yuichi Hamamura, Chizu Matsumoto, Yoshiyuki Tsunoda, Koji Kamoda, Yoshio Iwata, Kenji Kanamitsu, Daisuke Fujiki, Fujihiko Kojika, Hiromi Fujita, Yasuo Nakagawa, Shun'ichi Kaneko: Development of an Enterprise-Wide Yield Management System Using Critical Area Analysis for High-Product-Mix Semiconductor Manufacturing. IEICE Transactions 92-C(1): 144-152 (2009)
	2002
1		Yuichi Hamamura, Kazunori Nemoto, Takaaki Kumazawa, Hisafumi Iwata, Kousuke Okuyama, Shiro Kamohara, Aritoshi Sugimoto: Repair Yield Simulation with Iterative Critical Area Analysis for Different Types of Failure. DFT 2002: 305-313

Coauthor Index

1	Daisuke Fujiki	[2]
2	Hiromi Fujita	[2]
3	Hisafumi Iwata	[1]
4	Yoshio Iwata	[2]
5	Koji Kamoda	[2]
6	Shiro Kamohara	[1] [3]
7	Kenji Kanamitsu	[2] [3]
8	Shun'ichi Kaneko	[2]
9	Yoshiyuki Kaneko	[3]
10	Fujihiko Kojika	[2]
11	Takaaki Kumazawa	[1]
12	Chizu Matsumoto	[2] [3]
13	Isao Miyazaki	[3]
14	Yasuo Nakagawa	[2]
15	Kazunori Nemoto	[1]
16	Kousuke Okuyama	[1]
17	Aritoshi Sugimoto	[1]
18	Yoshiyuki Tsunoda	[2] [3]
19	Hiroshi Uozaki	[3]

Last update Thu May 31 18:55:10 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page