Shuji Hamada

	2006
7		Masayasu Fukunaga, Seiji Kajihara, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato: A dynamic test compaction procedure for high-quality path delay testing. ASP-DAC 2006: 348-353
6		Seiji Kajihara, Shohei Morishima, Akane Takuma, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato: A Framework of High-quality Transition Fault ATPG for Scan Circuits. ITC 2006: 1-6
5		Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Yasuyuki Noduyama, Yasuo Sato: Recognition of Sensitized Longest Paths in Transition Delay Test. ITC 2006: 1-6
4		Yasuo Sato, Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Seiji Kajihara: A Statistical Quality Model for Delay Testing. IEICE Transactions 89-C(3): 349-355 (2006)
	2005
3		Yasuo Sato, Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Seiji Kajihara: Evaluation of the statistical delay quality model. ASP-DAC 2005: 305-310
2		Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato: Path delay test compaction with process variation tolerance. DAC 2005: 845-850
1		Yasuo Sato, Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Yasuyuki Nozuyama, Seiji Kajihara: Invisible delay quality - SDQM model lights up what could not be seen. ITC 2005: 9

Coauthor Index

1	Masayasu Fukunaga	[2] [7]
2	Seiji Kajihara	[1] [2] [3] [4] [6] [7]
3	Toshiyuki Maeda	[1] [2] [3] [4] [5] [6] [7]
4	Shohei Morishima	[6]
5	Yasuyuki Noduyama	[5]
6	Yasuyuki Nozuyama	[1]
7	Yasuo Sato	[1] [2] [3] [4] [5] [6] [7]
8	Atsuo Takatori	[1] [3] [4] [5]
9	Akane Takuma	[6]
10	Xiaoqing Wen	[2] [6] [7]

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