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| 2000 | ||
|---|---|---|
| 2 | Tomoya Kawagoe, Jun Ohtani, Mitsutaka Niiro, Tukasa Ooishi, Mitsuhiro Hamada, Hideto Hidaka: A built-in self-repair analyzer (CRESTA) for embedded DRAMs. ITC 2000: 567-574 | |
| 1996 | ||
| 1 | Narumi Sakashita, Fumihiro Okuda, Ken'ichi Shimomura, Hiroki Shimano, Mitsuhiro Hamada, Tetsuo Tada, Shinji Komori, Kazuo Kyuma, Akihiko Yasuoka, Haruhiko Abe: A Built-In Self-Test Circuit with Timing Margin Test Function in a 1Gbit Synchronous DRAM. ITC 1996: 319-324 | |
Colors in the list of coauthors
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