Dorothy June M. Hamada

	2012
4		William J. Roesch, Dorothy June M. Hamada, David Littleton: Introducing a scale structure to correlate quality and reliability. Microelectronics Reliability 52(1): 16-22 (2012)
	2011
3		David Littleton, Dorothy June M. Hamada, William J. Roesch: Drainage ratio impact on void creation in gold interconnect. Microelectronics Reliability 51(2): 240-245 (2011)
	2008
2		Dorothy June M. Hamada, William J. Roesch: A wafer-level approach to device lifetesting. Microelectronics Reliability 48(7): 985-989 (2008)
	2005
1		William J. Roesch, Dorothy June M. Hamada: Metal defect yield and reliability relationships. Microelectronics Reliability 45(12): 1875-1881 (2005)

Coauthor Index

1	David Littleton	[3] [4]
2	William J. Roesch	[1] [2] [3] [4]

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