Achintya Halder

	2012
14		Deepak Kumar Meher, Arunkumar Salimath, Achintya Halder: An Ultra-low Power Symbol Detection Methodology and Its Circuit Implementation for a Wake-up Receiver in Wireless Sensor Nodes. VLSI Design 2012: 274-279
13		Amitava Ghosh, Isha Das, Achintya Halder: An Energy Efficient Oscillator Frequency Calibration Methodology Using Fraction Phase Computation. VLSI Design 2012: 85-91
	2008
12		Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee: System-Level Specification Testing Of Wireless Transceivers. IEEE Trans. VLSI Syst. 16(3): 263-276 (2008)
	2006
11		Achintya Halder, Abhijit Chatterjee: Low-Cost Production Testing of Wireless Transmitters. VLSI Design 2006: 437-442
	2005
10		Achintya Halder, Abhijit Chatterjee: Low-cost Production Test of BER for Wireless Receivers. Asian Test Symposium 2005: 64-69
9		Achintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee: A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode. VLSI Design 2005: 289-294
8		Achintya Halder, Abhijit Chatterjee: Low-Cost Alternate EVM Test for Wireless Receiver Systems. VTS 2005: 255-260
7		Soumendu Bhattacharya, Achintya Halder, Ganesh Srinivasan, Abhijit Chatterjee: Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications. J. Electronic Testing 21(3): 323-339 (2005)
6		Achintya Halder, Abhijit Chatterjee: Test generation for specification test of analog circuits using efficient test response observation methods. Microelectronics Journal 36(9): 820-832 (2005)
	2004
5		Achintya Halder, Abhijit Chatterjee: Automated Test Generation and Test Point Selection for Specification Test of Analog Circuits. ISQED 2004: 401-406
4		Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee: System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. VTS 2004: 229-236
	2003
3		Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee: Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models. ITC 2003: 665-673
	2002
2		Achintya Halder, Abhijit Chatterjee, Pramodchandran N. Variyam, John Ridley: Measuring Stray Capacitance on Tester Hardware. VTS 2002: 351-356
	2001
1		Achintya Halder, Abhijit Chatterjee: Specification Based Digital Compatible Built-in Test of Embedded Analog Circuits. Asian Test Symposium 2001: 344-

Coauthor Index

1	Soumendu Bhattacharya	[3] [4] [7] [9] [12]
2	Abhijit Chatterjee	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12]
3	Sasikumar Cherubal	[4]
4	Isha Das	[13]
5	Amitava Ghosh	[13]
6	Deepak Kumar Meher	[14]
7	John Ridley	[2]
8	Arunkumar Salimath	[14]
9	Ganesh Srinivasan	[4] [7] [9]
10	Pramodchandran N. Variyam	[2]

Colors in the list of coauthors

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