 | 2010 |
|---|
| 9 |       | Kentaro Katayama,
Shiho Hagiwara,
Hiroshi Tsutsui,
Hiroyuki Ochi,
Takashi Sato:
Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis.
ICCAD 2010: 703-708 |
| 8 | | Takanori Date,
Shiho Hagiwara,
Kazuya Masu,
Takashi Sato:
Robust importance sampling for efficient SRAM yield analysis.
ISQED 2010: 15-21 |
| 7 | | Shiho Hagiwara,
Koh Yamanaga,
Ryo Takahashi,
Kazuya Masu,
Takashi Sato:
Linear time calculation of state-dependent power distribution network capacitance.
ISQED 2010: 75-80 |
| 6 | | Shiho Hagiwara,
Koh Yamanaga,
Ryo Takahashi,
Kazuya Masu,
Takashi Sato:
Linear Time Calculation of On-Chip Power Distribution Network Capacitance Considering State-Dependence.
IEICE Transactions 93-A(12): 2409-2416 (2010) |
| 2009 |
|---|
| 5 | | Shiho Hagiwara,
Takashi Sato,
Kazuya Masu:
Analytical Estimation of Path-Delay Variation for Multi-Threshold CMOS Circuits.
IEICE Transactions 92-A(4): 1031-1038 (2009) |
| 2008 |
|---|
| 4 | | Shiho Hagiwara,
Takumi Uezono,
Takashi Sato,
Kazuya Masu:
Application of Correlation-Based Regression Analysis for Improvement of Power Distribution Network.
IEICE Transactions 91-A(4): 951-956 (2008) |
| 2007 |
|---|
| 3 | | Shiho Hagiwara,
Takumi Uezono,
Takashi Sato,
Kazuya Masu:
Improvement of power distribution network using correlation-based regression analysis.
ACM Great Lakes Symposium on VLSI 2007: 513-516 |
| 2 | | Takashi Sato,
Takumi Uezono,
Shiho Hagiwara,
Kenichi Okada,
Shuhei Amakawa,
Noriaki Nakayama,
Kazuya Masu:
A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation.
ISQED 2007: 21-26 |
| 1 | | Takashi Sato,
Shiho Hagiwara,
Takumi Uezono,
Kazuya Masu:
Weakness Identification for Effective Repair of Power Distribution Network.
PATMOS 2007: 222-231 |
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