Sébastien Haendler

	2003
2		François Dieudonné, Sébastien Haendler, Jalal Jomaah, Francis Balestra: Low frequency noise in 0.12 mum partially and fully depleted SOI technology. Microelectronics Reliability 43(2): 243-248 (2003)
	2001
1		Sébastien Haendler, Jalal Jomaah, G. Ghibaudo, Francis Balestra: Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors. Microelectronics Reliability 41(6): 855-860 (2001)

Coauthor Index

1	Francis Balestra	[1] [2]
2	François Dieudonné	[2]
3	Gérard Ghibaudo (G. Ghibaudo)	[1]
4	Jalal Jomaah	[1] [2]

Last update Thu May 31 18:55:10 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page