Oliver F. Haberl

	1995
4		Oliver F. Haberl, Thomas Kropf: HIST: A hierarchical self test methodology for chips, boards, and systems. J. Electronic Testing 6(1): 85-106 (1995)
	1994
3		Oliver F. Haberl, Thomas Kropf: Self Testable Boards with Standard IEEE 1149.5 Module Test and Maintenance (MTM) Bus Interface. EDAC-ETC-EUROASIC 1994: 220-225
	1992
2		Oliver F. Haberl, Thomas Kropf: HIST: A Methodology for the Automatic Insertion of a Hierarchical Self Test. ITC 1992: 732-741
	1990
1		Sybille Hellebrand, Hans-Joachim Wunderlich, Oliver F. Haberl: Generating pseudo-exhaustive vectors for external testing. ITC 1990: 670-679

Coauthor Index

1	Sybille Hellebrand	[1]
2	Thomas Kropf	[2] [3] [4]
3	Hans-Joachim Wunderlich	[1]

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