 | 2012 |
|---|
| 8 |       | Gilles Fritz,
Vincent Beroulle,
Oum-El-Kheir Aktouf,
David Hély:
Evaluation of a new RFID system performance monitoring approach.
DATE 2012: 1439-1442 |
| 2011 |
|---|
| 7 | | David Hély,
Vincent Beroulle,
Feng Lu,
José Ramón García Oya:
Towards an unified IP verification and robustness analysis platform.
DDECS 2011: 53-58 |
| 6 | | Gilles Fritz,
Boutheina Maaloul,
Vincent Beroulle,
Oum-El-Kheir Aktouf,
David Hély:
Read rate profile monitoring for defect detection in RFID Systems.
RFID-TA 2011: 89-94 |
| 5 | | Gilles Fritz,
Vincent Beroulle,
Oum-El-Kheir Aktouf,
Minh Duc Nguyen,
David Hély:
RFID System On-line Testing Based on the Evaluation of the Tags Read-Error-Rate.
J. Electronic Testing 27(3): 267-276 (2011) |
| 2007 |
|---|
| 4 | | David Hély,
Frédéric Bancel,
Marie-Lise Flottes,
Bruno Rouzeyre:
Securing Scan Control in Crypto Chips.
J. Electronic Testing 23(5): 457-464 (2007) |
| 2006 |
|---|
| 3 | | David Hély,
Frédéric Bancel,
Marie-Lise Flottes,
Bruno Rouzeyre:
A secure scan design methodology.
DATE 2006: 1177-1178 |
| 2 | | David Hély,
Frédéric Bancel,
Marie-Lise Flottes,
Bruno Rouzeyre:
Secure Scan Techniques: A Comparison.
IOLTS 2006: 119-124 |
| 2004 |
|---|
| 1 | | David Hély,
Marie-Lise Flottes,
Frédéric Bancel,
Bruno Rouzeyre,
Nicolas Bérard,
Michel Renovell:
Scan Design and Secure Chip.
IOLTS 2004: 219-226 |
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