Wolfgang Gustin

	2008
3		Stefano Aresu, Reinhard Pufall, Michael Goroll, Wolfgang Gustin: NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique. Microelectronics Reliability 48(8-9): 1310-1312 (2008)
2		Michael Goroll, Reinhard Pufall, Stefano Aresu, Wolfgang Gustin: New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure. Microelectronics Reliability 48(8-9): 1509-1512 (2008)
	2005
1		Christian Schlünder, Ralf Brederlow, Benno Ankele, Wolfgang Gustin, Karl Goser, Roland Thewes: Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits. Microelectronics Reliability 45(1): 39-46 (2005)

Coauthor Index

1	Benno Ankele	[1]
2	Stefano Aresu	[2] [3]
3	Ralf Brederlow	[1]
4	Michael Goroll	[2] [3]
5	Karl Goser	[1]
6	Reinhard Pufall	[2] [3]
7	Christian Schlünder	[1]
8	Roland Thewes	[1]

Colors in the list of coauthors

Last update Fri Jun 1 15:44:53 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page