Ruifeng Guo

	2011
38		Xun Tang, Wu-Tung Cheng, Ruifeng Guo, Huaxing Tang, Sudhakar M. Reddy: Diagnosis of Multiple Faults Based on Fault-Tuple Equivalence Tree. DFT 2011: 217-225
37		Jianjun Peng, Ruifeng Guo, Jiping Li, Zhixiang Shao, Jie Li: Research on tool swept volume in NC simulation. EMEIT 2011: 2687-2690
36		Zhixiang Shao, Ruifeng Guo, Jie Li, Jianjun Peng: Accurate Modeling Method for Generalized Tool Swept Volume in 5-axis NC Machining Simulation. JSW 6(10): 2056-2063 (2011)
	2010
35		Ke Peng, Yu Huang, Ruifeng Guo, Wu-Tung Cheng, Mohammad Tehranipoor: Emulating and diagnosing IR-drop by using dynamic SDF. ASP-DAC 2010: 511-516
34		Xun Tang, Wu-Tung Cheng, Ruifeng Guo, Sudhakar M. Reddy: Diagnosis of Multiple Physical Defects Using Logic Fault Models. Asian Test Symposium 2010: 94-99
33		Jing Zeng, Ruifeng Guo, Wu-Tung Cheng, Michael Mateja, Jing Wang, Kun-Han Tsai, Ken Amstutz: Scan based speed-path debug for a microprocessor. European Test Symposium 2010: 207-212
32		Xiuwu Zhang, Ruifeng Guo, Weimin Lei, Wei Zhang: A Topology-Aware Relay Lookup Scheme for P2P VoIP System. IJCNS 3(2): 119-125 (2010)
	2009
31		Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen: Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns. Asian Test Symposium 2009: 35-40
30		Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. Reddy, Yu Huang: On Improving Diagnostic Test Generation for Scan Chain Failures. Asian Test Symposium 2009: 41-46
29		Kun-Han Tsai, Ruifeng Guo, Wu-Tung Cheng: At-Speed Scan Test Method for the Timing Optimization and Calibration. Asian Test Symposium 2009: 430-433
28		Wanfu Ding, Ruifeng Guo: An Effective RM-Based Scheduling Algorithm for Fault-Tolerant Real-Time Systems. CSE (2) 2009: 759-764
27		Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. Reddy: Improving compressed test pattern generation for multiple scan chain failure diagnosis. DATE 2009: 1000-1005
26		Ruifeng Guo, Wu-Tung Cheng, Kun-Han Tsai: Speed-Path Debug Using At-Speed Scan Test Patterns. European Test Symposium 2009: 11-16
25		Wanfu Ding, Ruifeng Guo: Enhancing the Success Rate of Primary Version While Guaranteeing Fault-Tolerant Capability for Real-Time Systems. PRDC 2009: 351-356
	2008
24		Yu Huang, Wu-Tung Cheng, Ruifeng Guo: Diagnose Multiple Stuck-at Scan Chain Faults. European Test Symposium 2008: 105-110
23		Wanfu Ding, Ruifeng Guo: Design and Evaluation of Sectional Real-Time Scheduling Algorithms Based on System Load. ICYCS 2008: 14-18
22		Ruifeng Guo, Liyang Lai, Yu Huang, Wu-Tung Cheng: Detection and Diagnosis of Static Scan Cell Internal Defect. ITC 2008: 1-10
21		Yu Huang, Ruifeng Guo, Wu-Tung Cheng, James Chien-Mo Li: Survey of Scan Chain Diagnosis. IEEE Design & Test of Computers 25(3): 240-248 (2008)
	2007
20		Ruifeng Guo, Yu Huang, Wu-Tung Cheng: A complete test set to diagnose scan chain failures. ITC 2007: 1-10
19		Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Will Hsu, Yuan-Shih Chen, Albert Mann: Diagnose compound scan chain and system logic defects. ITC 2007: 1-10
18		Vishnu C. Vimjam, Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang: Using Scan-Dump Values to Improve Functional-Diagnosis Methodology. VTS 2007: 231-238
	2006
17		Ruifeng Guo, Subhasish Mitra, Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman: Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. VTS 2006: 66-71
16		Ruifeng Guo, Srikanth Venkataraman: An algorithmic technique for diagnosis of faulty scan chains. IEEE Trans. on CAD of Integrated Circuits and Systems 25(9): 1861-1868 (2006)
	2005
15		Zoran Stanojevic, Ruifeng Guo, Subhasish Mitra, Srikanth Venkataraman: Enabling yield analysis with X-compact. ITC 2005: 9
14		Dong Yu, Hu Lin, Ruifeng Guo, Jiangang Yang, Pengfei Xiao: The Research on Real-Time Middleware for Open Architecture Controller. RTCSA 2005: 80-83
	2004
13		Srikanth Venkataraman, Srihari Sivaraj, Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo: An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. VTS 2004: 23-30
	2003
12		Xiaoming Yu, Enamul Amyeen, Srikanth Venkataraman, Ruifeng Guo, Irith Pomeranz: Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation. VTS 2003: 351-358
11		Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz: Reverse-order-restoration-based static test compaction for synchronous sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 22(3): 293-304 (2003)
10		Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz: PROPTEST: a property-based test generator for synchronous sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 22(8): 1080-1091 (2003)
	2001
9		Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz: On Improving a Fault Simulation Based Test Generator for Synchronous Sequential Circuits. Asian Test Symposium 2001: 82-
8		Ruifeng Guo, Srikanth Venkataraman: A technique for fault diagnosis of defects in scan chains. ITC 2001: 268-277
7		Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy: On Improving Static Test Compaction for Sequential Circuits. VLSI Design 2001: 111-116
	1999
6		Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz: Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction. DAC 1999: 653-659
5		Yun Shao, Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz: The effects of test compaction on fault diagnosis. ITC 1999: 1083-1089
4		Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy: A Fault Simulation Based Test Pattern Generator for Synchronous Sequential Circuits. VTS 1999: 260-267
3		Irith Pomeranz, Sudhakar M. Reddy, Ruifeng Guo: Static test compaction for synchronous sequential circuits based on vector restoration. IEEE Trans. on CAD of Integrated Circuits and Systems 18(7): 1040-1049 (1999)
	1998
2		Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy: On Speeding-Up Vector Restoration Based Static Compaction of Test Sequences for Sequential Circuits . Asian Test Symposium 1998: 467-471
1		Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy: Procedures for Static Compaction of Test Sequences for Synchronous Sequential Circuits Based on Vector Restoration. DATE 1998: 583-587

Coauthor Index

1	Ken Amstutz	[33]
2	Enamul Amyeen	[12] [13] [17] [18]
3	Yuan-Shih Chen	[19] [31]
4	Wu-Tung Cheng	[19] [20] [21] [22] [24] [26] [27] [29] [30] [31] [33] [34] [35] [38]
5	Wanfu Ding	[23] [25] [28]
6	Michael S. Hsiao	[18]
7	Will Hsu	[19]
8	Yu Huang	[19] [20] [21] [22] [24] [30] [31] [35]
9	Feng-Ming Kuo	[31]
10	Liyang Lai	[22]
11	Jinkyu Lee	[17]
12	Sangbong Lee	[13]
13	Weimin Lei	[32]
14	Chien-Mo James Li (James Chien-Mo Li, J. C.-M. Li)	[21]
15	Jie Li	[36] [37]
16	Jiping Li	[37]
17	Hu Lin	[14]
18	Albert Mann	[19]
19	Michael Mateja	[33]
20	Subhasish Mitra	[15] [17]
21	Ajay Ojha	[13]
22	Jianjun Peng	[36] [37]
23	Ke Peng	[35]
24	Irith Pomeranz	[1] [2] [3] [4] [5] [6] [7] [9] [10] [11] [12]
25	Sudhakar M. Reddy	[1] [2] [3] [4] [5] [6] [7] [9] [10] [11] [27] [30] [34] [38]
26	Zhixiang Shao	[36] [37]
27	Yun Shao	[5]
28	Srihari Sivaraj	[13] [17]
29	Zoran Stanojevic	[15]
30	Ting-Pu Tai	[31]
31	Huaxing Tang	[38]
32	Xun Tang	[27] [30] [34] [38]
33	Mohammad Tehranipoor	[35]
34	Kun-Han Tsai	[26] [29] [33]
35	Srikanth Venkataraman	[8] [12] [13] [15] [16] [17] [18]
36	Vishnu C. Vimjam	[18]
37	Jing Wang	[33]
38	Pengfei Xiao	[14]
39	Jiangang Yang	[14]
40	Kai Yang	[18]
41	Dong Yu	[14]
42	Xiaoming Yu	[12]
43	Jing Zeng	[33]
44	Xiuwu Zhang	[32]
45	Wei Zhang	[32]

Colors in the list of coauthors

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