Arun Gunda

	2010
13		Narendra Devta-Prasanna, Arun Gunda, Sudhakar M. Reddy, Irith Pomeranz: Multiple fault activation cycle tests for transistor stuck-open faults. ITC 2010: 821
12		Narendra Devta-Prasanna, Arun Gunda: Clock Gate Test Points. ITC 2010: 84-93
	2009
11		Narendra Devta-Prasanna, Sandeep Kumar Goel, Arun Gunda, Mark Ward, P. Krishnamurthy: Accurate measurement of small delay defect coverage of test patterns. ITC 2009: 1-10
	2008
10		Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda: Comparative study of centralised and distributed compatibility-based test data compression. IET Computers & Digital Techniques 2(2): 108-117 (2008)
	2007
9		Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda: Systematic Scan Reconfiguration. ASP-DAC 2007: 738-743
8		Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Erik Chmelar, M. Grinchuk, Arun Gunda: Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. IEEE Trans. on CAD of Integrated Circuits and Systems 26(5): 907-918 (2007)
	2006
7		Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz: Test Generation for Open Defects in CMOS Circuits. DFT 2006: 41-49
6		Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz: A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults. European Test Symposium 2006: 185-192
	2005
5		Narendra Devta-Prasanna, Sudhakar M. Reddy, Arun Gunda, P. Krishnamurthy, Irith Pomeranz: Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions. Asian Test Symposium 2005: 202-207
4		Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda: Should Illinois-Scan Based Architectures be Centralized or Distributed? DFT 2005: 406-414
3		Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz: A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals. ICCD 2005: 471-474
2		Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz: Methods for improving transition delay fault coverage using broadside tests. ITC 2005: 10
	1995
1		Kaushik De, Arun Gunda: Failure Analysis for Full-Scan Circuits. ITC 1995: 636-645

Coauthor Index

1	Ahmad A. Al-Yamani	[4] [8] [9] [10]
2	Erik Chmelar	[8]
3	Kaushik De	[1]
4	Narendra Devta-Prasanna	[2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13]
5	Sandeep Kumar Goel	[11]
6	M. Grinchuk	[8]
7	P. Krishnamurthy	[2] [3] [5] [6] [7] [11]
8	Irith Pomeranz	[2] [3] [5] [6] [7] [13]
9	Sudhakar M. Reddy	[2] [3] [5] [6] [7] [13]
10	Mark Ward	[11]

Colors in the list of coauthors

Last update Fri Jun 1 15:44:53 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page