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| 2004 | ||
|---|---|---|
| 1 | Yang Jiangping, Li Guixiang, Wang Wanglei: A model of VLSI interconnect test based on boundary scan. ICARCV 2004: 557-561 | |
| 1 | Yang Jiangping | [1] |
| 2 | Wang Wanglei | [1] |
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