N. Guitard

	2006
3		F. Essely, F. Darracq, Vincent Pouget, M. Remmach, Felix Beaudoin, N. Guitard, M. Bafleur, Philippe Perdu, André Touboul, Dean Lewis: Application of various optical techniques for ESD defect localization. Microelectronics Reliability 46(9-11): 1563-1568 (2006)
	2005
2		N. Guitard, F. Essely, D. Trémouilles, M. Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis: Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectronics Reliability 45(9-11): 1415-1420 (2005)
	2003
1		D. Trémouilles, G. Bertrand, M. Bafleur, Felix Beaudoin, Philippe Perdu, N. Guitard, L. Lescouzères: TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. Microelectronics Reliability 43(1): 71-79 (2003)

Coauthor Index

1	M. Bafleur	[1] [2] [3]
2	Felix Beaudoin	[1] [3]
3	G. Bertrand	[1]
4	F. Darracq	[3]
5	F. Essely	[2] [3]
6	L. Lescouzères	[1]
7	Dean Lewis	[2] [3]
8	Nicolas Nolhier	[2]
9	Philippe Perdu	[1] [2] [3]
10	Vincent Pouget	[2] [3]
11	M. Remmach	[3]
12	André Touboul	[2] [3]
13	D. Trémouilles (David Trémouilles)	[1] [2]

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