 | 2012 |
| 35 |  | Michelangelo Grosso,
Wilson Javier Perez Holguin,
Ernesto Sánchez,
Matteo Sonza Reorda,
Alberto Paolo Tonda,
J. Velasco Medina:
Software-Based Testing for System Peripherals.
J. Electronic Testing 28(2): 189-200 (2012) |
| 2011 |
| 34 |  | Paolo Bernardi,
Michelangelo Grosso,
Ernesto Sánchez,
Oscar Ballan:
Fault grading of software-based self-test procedures for dependable automotive applications.
DATE 2011: 513-514 |
| 33 |  | Jorge Luis Lagos-Benites,
Michelangelo Grosso,
Matteo Sonza Reorda,
G. Audisio,
M. Pipponzi,
Marco Sabatini,
V. A. Avantaggiati:
An FPGA-Emulation-Based Platform for Characterization of Digital Baseband Communication Systems.
DFT 2011: 391-398 |
| 32 |  | Jorge Luis Lagos-Benites,
Michelangelo Grosso,
Luca Sterpone,
Matteo Sonza Reorda,
G. Audisio,
M. Pipponzi,
Marco Sabatini:
A Low-Cost Emulation System for Fast Co-verification and Debug.
European Test Symposium 2011: 212 |
| 31 |  | Michelangelo Grosso,
Wilson Javier Perez Holguin,
Danilo Ravotto,
Ernesto Sánchez,
Matteo Sonza Reorda,
Alberto Paolo Tonda,
Jaime Velasco-Medina:
Functional Verification of DMA Controllers.
J. Electronic Testing 27(4): 505-516 (2011) |
| 2010 |
| 30 |  | Michelangelo Grosso,
Wilson J. H. Perez,
Danilo Ravotto,
Edgar E. Sánchez,
Matteo Sonza Reorda,
J. Velasco Medina:
A software-based self-test methodology for system peripherals.
European Test Symposium 2010: 195-200 |
| 29 |  | Paolo Bernardi,
Michelangelo Grosso,
Matteo Sonza Reorda:
An adaptive tester architecture for volume diagnosis.
European Test Symposium 2010: 227-232 |
| 28 |  | Michelangelo Grosso,
Matteo Sonza Reorda,
Marta Portela-García,
Mario García-Valderas,
Celia López-Ongil,
Luis Entrena:
An on-line fault detection technique based on embedded debug features.
IOLTS 2010: 167-172 |
| 27 |  | Paolo Rech,
Michelangelo Grosso,
Fabio Melchiori,
D. Loparco,
Davide Appello,
Luigi Dilillo,
Alessandro Paccagnella,
Matteo Sonza Reorda:
Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts.
IOLTS 2010: 29-34 |
| 26 |  | M. Di Marzio,
Michelangelo Grosso,
Matteo Sonza Reorda,
Luca Sterpone,
G. Audisio,
Marco Sabatini:
A novel scalable and reconfigurable emulation platform for embedded systems verification.
ISCAS 2010: 865-868 |
| 25 |  | Paolo Bernardi,
Michelangelo Grosso,
Matteo Sonza Reorda,
Y. Zhang:
A programmable BIST for DRAM testing and diagnosis.
ITC 2010: 447-456 |
| 24 |  | Oscar Ballan,
Paolo Bernardi,
Giovanni Fontana,
Michelangelo Grosso,
Ernesto Sánchez:
A Fault Grading Methodology for Software-Based Self-Test Programs in Systems-on-Chip.
MTV 2010: 43-46 |
| 23 |  | Paolo Bernardi,
Leticia Maria Veiras Bolzani Poehls,
Michelangelo Grosso,
Matteo Sonza Reorda:
A Hybrid Approach for Detection and Correction of Transient Faults in SoCs.
IEEE Trans. Dependable Sec. Comput. 7(4): 439-445 (2010) |
| 22 |  | Paolo Bernardi,
Michelangelo Grosso,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug.
IET Computers & Digital Techniques 4(2): 104-113 (2010) |
| 2009 |
| 21 |  | Davide Appello,
Paolo Bernardi,
R. Cagliesi,
M. Giancarlini,
Michelangelo Grosso,
Edgar E. Sánchez,
Matteo Sonza Reorda:
Automatic Functional Stress Pattern Generation for SoC Reliability Characterization.
European Test Symposium 2009: 93-98 |
| 20 |  | Paolo Rech,
Simone Gerardin,
Alessandro Paccagnella,
Paolo Bernardi,
Michelangelo Grosso,
Matteo Sonza Reorda,
Davide Appello:
Evaluating Alpha-induced soft errors in embedded microprocessors.
IOLTS 2009: 69-74 |
| 19 |  | Michelangelo Grosso,
Matteo Sonza Reorda:
Exploiting embedded FPGA in on-line software-based test strategies for microprocessor cores.
IOLTS 2009: 95-100 |
| 18 |  | Davide Appello,
Paolo Bernardi,
Simone Gerardin,
Michelangelo Grosso,
Alessandro Paccagnella,
Paolo Rech,
Matteo Sonza Reorda:
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study.
VTS 2009: 276-281 |
| 17 |  | Davide Appello,
Paolo Bernardi,
Michelangelo Grosso,
Ernesto Sánchez,
Matteo Sonza Reorda:
Effective Diagnostic Pattern Generation Strategy for Transition-Delay Faults in Full-Scan SOCs.
IEEE Trans. VLSI Syst. 17(11): 1654-1659 (2009) |
| 2008 |
| 16 |  | Davide Appello,
Paolo Bernardi,
R. Cagliesi,
M. Giancarlini,
Michelangelo Grosso:
An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs.
European Test Symposium 2008: 140-145 |
| 15 |  | Paolo Bernardi,
Kyriakos Christou,
Michelangelo Grosso,
Maria K. Michael,
Ernesto Sánchez,
Matteo Sonza Reorda:
Exploiting MOEA to Automatically Geneate Test Programs for Path-Delay Faults in Microprocessors.
EvoWorkshops 2008: 224-234 |
| 14 |  | Paolo Bernardi,
Michelangelo Grosso,
Ernesto Sánchez,
Matteo Sonza Reorda:
A Deterministic Methodology for Identifying Functionally Untestable Path-Delay Faults in Microprocessor Cores.
MTV 2008: 103-108 |
| 13 |  | Kyriakos Christou,
Maria K. Michael,
Paolo Bernardi,
Michelangelo Grosso,
Ernesto Sánchez,
Matteo Sonza Reorda:
A Novel SBST Generation Technique for Path-Delay Faults in Microprocessors Exploiting Gate- and RT-Level Descriptions.
VTS 2008: 389-394 |
| 2007 |
| 12 |  | Paolo Bernardi,
Michelangelo Grosso,
Matteo Sonza Reorda:
Hardware-accelerated path-delay fault grading of functional test programs for processor-based systems.
ACM Great Lakes Symposium on VLSI 2007: 411-416 |
| 11 |  | Jorge Luis Lagos-Benites,
Davide Appello,
Paolo Bernardi,
Michelangelo Grosso,
Danilo Ravotto,
Edgar E. Sánchez,
Matteo Sonza Reorda:
An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains.
DFT 2007: 291-300 |
| 10 |  | Michelangelo Grosso,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
Safety Evaluation of NanoFabrics.
DFT 2007: 418-426 |
| 9 |  | Paolo Bernardi,
Michelangelo Grosso,
Ernesto Sánchez,
Matteo Sonza Reorda:
On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores.
European Test Symposium 2007: 179-184 |
| 8 |  | Paolo Bernardi,
Michelangelo Grosso,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
A System-layer Infrastructure for SoC Diagnosis.
J. Electronic Testing 23(5): 389-404 (2007) |
| 2006 |
| 7 |  | Paolo Bernardi,
Michelangelo Grosso:
Test Considerations about the Structured ASIC Paradigm.
DDECS 2006: 232-233 |
| 6 |  | Davide Appello,
Vincenzo Tancorre,
Paolo Bernardi,
Michelangelo Grosso,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
Embedded Memory Diagnosis: An Industrial Workflow.
ITC 2006: 1-9 |
| 5 |  | Davide Appello,
Vincenzo Tancorre,
Paolo Bernardi,
Michelangelo Grosso,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
On the Automation of the Test Flow of Complex SoCs.
VTS 2006: 166-171 |
| 4 |  | Paolo Bernardi,
Michelangelo Grosso,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
A Pattern Ordering Algorithm for Reducing the Size of Fault Dictionaries.
VTS 2006: 386-391 |
| 3 |  | Davide Appello,
Paolo Bernardi,
Michelangelo Grosso,
Matteo Sonza Reorda:
System-in-Package Testing: Problems and Solutions.
IEEE Design & Test of Computers 23(3): 203-211 (2006) |
| 2005 |
| 2 |  | Alberto Manzone,
Paolo Bernardi,
Michelangelo Grosso,
Maurizio Rebaudengo,
Ernesto Sánchez,
Matteo Sonza Reorda:
Integrating BIST Techniques for On-Line SoC Testing.
IOLTS 2005: 235-240 |
| 1 |  | Paolo Bernardi,
Michelangelo Grosso,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
Exploiting an I-IP for both Test and Silicon Debug of Microprocessor Cores.
MTV 2005: 55-62 |