G. Groos

	2005
3		Michael Heer, V. Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, M. Denison, Matthias Stecher, G. Groos: Automated setup for thermal imaging and electrical degradation study of power DMOS devices. Microelectronics Reliability 45(9-11): 1688-1693 (2005)
	2003
2		M. Blaho, Dionyz Pogany, Erich Gornik, M. Denison, G. Groos, Matthias Stecher: Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method. Microelectronics Reliability 43(4): 545-548 (2003)
	2001
1		Sergey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, Erich Gornik, G. Groos, Matthias Stecher: Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. Microelectronics Reliability 41(9-10): 1501-1506 (2001)

Coauthor Index

1	M. Blaho	[2] [3]
2	Sergey Bychikhin (Scrgey Bychikhin)	[1] [3]
3	M. Denison	[2] [3]
4	V. Dubec	[3]
5	Erich Gornik	[1] [2] [3]
6	Michael Heer	[3]
7	Martin Litzenberger	[1]
8	R. Pichler	[1]
9	Dionyz Pogany	[1] [2] [3]
10	Matthias Stecher	[1] [2] [3]

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