 | 2009 |
| 20 |  | Xiaoqin Sheng,
Hans G. Kerkhoff,
Amir Zjajo,
Guido Gronthoud:
Algorithms for ADC Multi-site Test with Digital Input Stimulus.
European Test Symposium 2009: 45-50 |
| 2008 |
| 19 |  | Vladimir A. Zivkovic,
Frank van der Heyden,
Guido Gronthoud,
Frans de Jong:
Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design.
European Test Symposium 2008: 27-32 |
| 2007 |
| 18 |  | Jens Anders,
Shaji Krishnan,
Guido Gronthoud:
Re-configuration of sub-blocks for effective application of time domain tests.
DATE 2007: 707-712 |
| 17 |  | Bram Kruseman,
Ananta K. Majhi,
Guido Gronthoud:
On Performance Testing with Path Delay Patterns.
VTS 2007: 29-34 |
| 16 |  | Ananta K. Majhi,
Mohamed Azimane,
Guido Gronthoud,
Maurice Lousberg,
Stefan Eichenberger,
Fred Bowen:
Memory Testing Under Different Stress Conditions: An Industrial Evaluation
CoRR abs/0710.4693: (2007) |
| 15 |  | Jing Wang,
Duncan M. Hank Walker,
Xiang Lu,
Ananta K. Majhi,
Bram Kruseman,
Guido Gronthoud,
Luis Elvira Villagra,
Paul J. A. M. van de Wiel,
Stefan Eichenberger:
Modeling Power Supply Noise in Delay Testing.
IEEE Design & Test of Computers 24(3): 226-234 (2007) |
| 14 |  | Xinyue Fan,
Will R. Moore,
Camelia Hora,
Guido Gronthoud:
Extending gate-level diagnosis tools to CMOS intra-gate faults.
IET Computers & Digital Techniques 1(6): 685-693 (2007) |
| 2006 |
| 13 |  | Jing Wang,
D. M. H. Walker,
Ananta K. Majhi,
Bram Kruseman,
Guido Gronthoud,
Luis Elvira Villagra,
Paul van de Wiel,
Stefan Eichenberger:
Power Supply Noise in Delay Testing.
ITC 2006: 1-10 |
| 12 |  | Xinyue Fan,
Will R. Moore,
Camelia Hora,
Mario H. Konijnenburg,
Guido Gronthoud:
A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis.
VTS 2006: 266-271 |
| 11 |  | Amir Zjajo,
José Pineda de Gyvez,
Guido Gronthoud:
Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated Circuits.
J. Electronic Testing 22(4-6): 399-409 (2006) |
| 2005 |
| 10 |  | Ananta K. Majhi,
Mohamed Azimane,
Guido Gronthoud,
Maurice Lousberg,
Stefan Eichenberger,
Fred Bowen:
Memory Testing Under Different Stress Conditions: An Industrial Evaluation.
DATE 2005: 438-443 |
| 9 |  | Xinyue Fan,
Will R. Moore,
Camelia Hora,
Guido Gronthoud:
A novel stuck-at based method for transistor stuck-open fault diagnosis.
ITC 2005: 9 |
| 8 |  | Estella Silva,
José Pineda de Gyvez,
Guido Gronthoud:
Functional vs. multi-VDD testing of RF circuits.
ITC 2005: 9 |
| 7 |  | Mohamed Azimane,
Ananta K. Majhi,
Guido Gronthoud,
Maurice Lousberg:
A New Algorithm for Dynamic Faults Detection in RAMs.
VTS 2005: 177-182 |
| 6 |  | José Pineda de Gyvez,
Guido Gronthoud,
Rashid Amine:
Multi-VDD Testing for Analog Circuits.
J. Electronic Testing 21(3): 311-322 (2005) |
| 2004 |
| 5 |  | Bram Kruseman,
Ananta K. Majhi,
Guido Gronthoud,
Stefan Eichenberger:
On Hazard-free Patterns for Fine-delay Fault Testing.
ITC 2004: 213-222 |
| 4 |  | José Pineda de Gyvez,
Guido Gronthoud,
Cristiano Cenci,
Martin Posch,
Thomas Burger,
Manfred Koller:
Power Supply Ramping for Quasi-static Testing of PLLs.
ITC 2004: 980-987 |
| 2003 |
| 3 |  | José Pineda de Gyvez,
Guido Gronthoud,
Rashid Amine:
VDD Ramp Testing for RF Circuits.
ITC 2003: 651-658 |
| 2 |  | Ananta K. Majhi,
Guido Gronthoud,
Camelia Hora,
Maurice Lousberg,
Pop Valer,
Stefan Eichenberger:
Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model.
VTS 2003: 345-350 |
| 2000 |
| 1 |  | Will R. Moore,
Guido Gronthoud,
Keith Baker,
Maurice Lousberg:
Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?
ITC 2000: 95-104 |