Guido Groeseneken

	2011
25		Felice Crupi, Massimo Alioto, Jacopo Franco, Paolo Magnone, Ben Kaczer, Guido Groeseneken, Jerome Mitard, Liesbeth Witters, Thomas Y. Hoffmann: Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling. ISCAS 2011: 2249-2252
	2010
24		Vaidyanathan Subramanian, Abdelkarim Mercha, Bertrand Parvais, Morin Dehan, Guido Groeseneken, Willy M. C. Sansen, Stefaan Decoutere: Identifying the Bottlenecks to the RF Performance of FinFETs. VLSI Design 2010: 111-116
23		Sandeep Sangameswaran, Jeroen De Coster, Guido Groeseneken, Ingrid De Wolf: Impact of design factors and environment on the ESD sensitivity of MEMS micromirrors. Microelectronics Reliability 50(9-11): 1383-1387 (2010)
	2009
22		Mirko Scholz, Dimitri Linten, Steven Thijs, Sandeep Sangameswaran, Masanori Sawada, Toshiyuki Nakaei, Takumi Hasebe, Guido Groeseneken: ESD On-Wafer Characterization: Is TLP Still the Right Measurement Tool? IEEE T. Instrumentation and Measurement 58(10): 3418-3426 (2009)
21		Dimitri Linten, Steven Thijs, Jonathan Borremans, Morin Dehan, D. Trémouilles, Mirko Scholz, M. I. Natarajan, Piet Wambacq, Stefaan Decoutere, Guido Groeseneken: A plug-and-play wideband RF circuit ESD protection methodology: T-diodes. Microelectronics Reliability 49(12): 1440-1446 (2009)
20		R. Fernández-García, Ben Kaczer, Guido Groeseneken: A CMOS circuit for evaluating the NBTI over a wide frequency range. Microelectronics Reliability 49(8): 885-891 (2009)
	2008
19		Georges G. E. Gielen, Peter H. N. De Wit, Elie Maricau, J. Loeckx, J. Martín-Martínez, Ben Kaczer, Guido Groeseneken, R. Rodríguez, M. Nafría: Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies. DATE 2008: 1322-1327
18		Guido Groeseneken, Ingrid De Wolf, A. J. Mouthaan, Jaap Bisschop: Editorial. Microelectronics Reliability 48(8-9): 1111 (2008)
	2007
17		A. Shickova, Ben Kaczer, A. Veloso, M. Aoulaiche, M. Houssa, H. E. Maes, Guido Groeseneken, J. A. Kittl: NBTI reliability of Ni FUSI/HfSiON gates: Effect of silicide phase. Microelectronics Reliability 47(4-5): 505-507 (2007)
16		A. Kerber, L. Pantisano, A. Veloso, Guido Groeseneken, M. Kerber: Reliability screening of high-k dielectrics based on voltage ramp stress. Microelectronics Reliability 47(4-5): 513-517 (2007)
15		Ben Kaczer, Robin Degraeve, Philippe Roussel, Guido Groeseneken: Gate oxide breakdown in FET devices and circuits: From nanoscale physics to system-level reliability. Microelectronics Reliability 47(4-5): 559-566 (2007)
14		M. Houssa, M. Aoulaiche, Stefan De Gendt, Guido Groeseneken, Marc M. Heyns: Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: Electrical characterization and modeling. Microelectronics Reliability 47(6): 880-889 (2007)
13		D. Trémouilles, Steven Thijs, Philippe Roussel, M. I. Natarajan, Vesselin K. Vassilev, Guido Groeseneken: Transient voltage overshoot in TLP testing - Real or artifact? Microelectronics Reliability 47(7): 1016-1024 (2007)
	2006
12		Steven Thijs, M. Natarajan Iyer, Dimitri Linten, Wutthinan Jeamsaksiri, T. Daenen, Robin Degraeve, Andries Scholten, Stefaan Decoutere, Guido Groeseneken: Implementation of plug-and-play ESD protection in 5.5GHz 90nm RF CMOS LNAs - Concepts, constraints and solutions. Microelectronics Reliability 46(5-6): 702-712 (2006)
11		R. Fernández, R. Rodríguez, M. Nafría, X. Aymerich, Ben Kaczer, Guido Groeseneken: FinFET and MOSFET preliminary comparison of gate oxide reliability. Microelectronics Reliability 46(9-11): 1608-1611 (2006)
	2005
10		Vesselin K. Vassilev, Steven Thijs, P. L. Segura, Piet Wambacq, Paul Leroux, Guido Groeseneken, M. I. Natarajan, H. E. Maes, Michiel Steyaert: ESD-RF co-design methodology for the state of the art RF-CMOS blocks. Microelectronics Reliability 45(2): 255-268 (2005)
9		Y.-L. Li, Zs. Tökei, Philippe Roussel, Guido Groeseneken, Karen Maex: Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability. Microelectronics Reliability 45(9-11): 1299-1304 (2005)
8		Vesselin K. Vassilev, V. A. Vashchenko, Ph. Jansen, Guido Groeseneken, M. ter Beek: ESD circuit model based protection network optimisation for extended-voltage NMOS drivers. Microelectronics Reliability 45(9-11): 1430-1435 (2005)
	2003
7		Vesselin K. Vassilev, S. Jenei, Guido Groeseneken, R. Venegas, Steven Thijs, V. De Heyn, M. Natarajan Iyer, Michiel Steyaert, H. E. Maes: High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices. Microelectronics Reliability 43(7): 1011-1020 (2003)
	2002
6		Ben Kaczer, Robin Degraeve, M. Rasras, A. De Keersgieter, K. Van de Mieroop, Guido Groeseneken: Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study. Microelectronics Reliability 42(4-5): 555-564 (2002)
5		Bart Keppens, V. De Heyn, M. Natarajan Iyer, Vesselin K. Vassilev, Guido Groeseneken: Significance of the failure criterion on transmission line pulse testing. Microelectronics Reliability 42(6): 901-907 (2002)
4		E. Andries, R. Dreesen, K. Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D'Olieslaeger, Jan D'Haen: Statistical aspects of the degradation of LDD nMOSFETs. Microelectronics Reliability 42(9-11): 1409-1413 (2002)
	2001
3		Karlheinz Bock, Bart Keppens, V. De Heyn, Guido Groeseneken, L. Y. Ching, A. Naem: Influence of gate length on ESD-performance for deep submicron CMOS technology. Microelectronics Reliability 41(3): 375-383 (2001)
2		R. Dreesen, K. Croes, J. Manca, Ward De Ceuninck, Luc De Schepper, A. Pergoot, Guido Groeseneken: A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation. Microelectronics Reliability 41(3): 437-443 (2001)
	1999
1		Marc M. Heyns, Twan Bearda, Ingrid Cornelissen, Stefan De Gendt, Robin Degraeve, Guido Groeseneken, Conny Kenens, D. Martin Knotter, Lee M. Loewenstein, Paul W. Mertens, Sofie Mertens, Marc Meuris, Tanya Nigam, Marc Schaekers, Ivo Teerlinck, Wilfried Vandervorst, Rita Vos, Klaus Wolke: Cost-effective cleaning and high-quality thin gate oxides. IBM Journal of Research and Development 43(3): 339-350 (1999)

Coauthor Index

1	Massimo Alioto	[25]
2	E. Andries	[4]
3	M. Aoulaiche	[14] [17]
4	X. Aymerich	[11]
5	Twan Bearda	[1]
6	M. ter Beek	[8]
7	Jaap Bisschop	[18]
8	Karlheinz Bock	[3]
9	Jonathan Borremans	[21]
10	Ward De Ceuninck	[2] [4]
11	L. Y. Ching	[3]
12	Ingrid Cornelissen	[1]
13	Jeroen De Coster	[23]
14	K. Croes	[2] [4]
15	Felice Crupi	[25]
16	Jan D'Haen	[4]
17	Marc D'Olieslaeger	[4]
18	T. Daenen	[12]
19	Stefaan Decoutere	[12] [21] [24]
20	Robin Degraeve	[1] [6] [12] [15]
21	Morin Dehan	[21] [24]
22	R. Dreesen	[2] [4]
23	R. Fernández	[11]
24	R. Fernández-García	[20]
25	Jacopo Franco	[25]
26	Stefan De Gendt	[1] [14]
27	Georges G. E. Gielen	[19]
28	Takumi Hasebe	[22]
29	V. De Heyn	[3] [5] [7]
30	Marc M. Heyns	[1] [14]
31	Thomas Y. Hoffmann	[25]
32	M. Houssa	[14] [17]
33	M. Natarajan Iyer	[5] [7] [12]
34	Ph. Jansen	[8]
35	Wutthinan Jeamsaksiri	[12]
36	S. Jenei	[7]
37	Ben Kaczer	[6] [11] [15] [17] [19] [20] [25]
38	A. De Keersgieter	[6]
39	Conny Kenens	[1]
40	Bart Keppens	[3] [5]
41	A. Kerber	[16]
42	M. Kerber	[16]
43	J. A. Kittl	[17]
44	D. Martin Knotter	[1]
45	Paul Leroux	[10]
46	Y.-L. Li	[9]
47	Dimitri Linten	[12] [21] [22]
48	K. F. Lo	[4]
49	J. Loeckx	[19]
50	Lee M. Loewenstein	[1]
51	H. E. Maes	[7] [10] [17]
52	Karen Maex	[9]
53	Paolo Magnone	[25]
54	J. Manca	[2]
55	Elie Maricau	[19]
56	J. Martín-Martínez	[19]
57	Abdelkarim Mercha	[24]
58	Paul W. Mertens	[1]
59	Sofie Mertens	[1]
60	Marc Meuris	[1]
61	K. Van de Mieroop	[6]
62	Jerome Mitard	[25]
63	A. J. Mouthaan	[18]
64	A. Naem	[3]
65	M. Nafría	[11] [19]
66	Toshiyuki Nakaei	[22]
67	M. I. Natarajan	[10] [13] [21]
68	Tanya Nigam	[1]
69	L. Pantisano	[16]
70	Bertrand Parvais	[24]
71	A. Pergoot	[2]
72	M. Rasras	[6]
73	R. Rodríguez	[11] [19]
74	Philippe Roussel	[9] [13] [15]
75	Sandeep Sangameswaran	[22] [23]
76	Willy M. C. Sansen	[24]
77	Masanori Sawada	[22]
78	Marc Schaekers	[1]
79	Luc De Schepper	[2] [4]
80	Andries Scholten	[12]
81	Mirko Scholz	[21] [22]
82	P. L. Segura	[10]
83	A. Shickova	[17]
84	Michiel Steyaert	[7] [10]
85	Vaidyanathan Subramanian	[24]
86	Ivo Teerlinck	[1]
87	Steven Thijs	[7] [10] [12] [13] [21] [22]
88	Zs. Tökei	[9]
89	D. Trémouilles (David Trémouilles)	[13] [21]
90	Wilfried Vandervorst	[1]
91	V. A. Vashchenko	[8]
92	Vesselin K. Vassilev	[5] [7] [8] [10] [13]
93	A. Veloso	[16] [17]
94	R. Venegas	[7]
95	Rita Vos	[1]
96	Piet Wambacq	[10] [21]
97	Peter H. N. De Wit	[19]
98	Liesbeth Witters	[25]
99	Ingrid De Wolf	[18] [23]
100	Klaus Wolke	[1]

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