M. Grinchuk

	2007
1		Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Erik Chmelar, M. Grinchuk, Arun Gunda: Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. IEEE Trans. on CAD of Integrated Circuits and Systems 26(5): 907-918 (2007)

Coauthor Index

1	Ahmad A. Al-Yamani	[1]
2	Erik Chmelar	[1]
3	Narendra Devta-Prasanna	[1]
4	Arun Gunda	[1]

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