B. Grimber

	2005
1		A. Sozza, Christian Dua, Erwan Morvan, B. Grimber, S. L. Delage: A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications. Microelectronics Reliability 45(9-11): 1617-1621 (2005)

Coauthor Index

1	S. L. Delage	[1]
2	Christian Dua	[1]
3	Erwan Morvan	[1]
4	A. Sozza	[1]

Last update Thu May 31 18:55:10 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page