Stéphane Grauby

	2009
11		Stéphane Grauby, Luis David Patiño Lopez, M. Amine Salhi, Etienne Puyoo, Jean-Michel Rampnoux, Wilfrid Claeys, Stefan Dilhaire: Joule expansion imaging techniques on microlectronic devices. Microelectronics Journal 40(9): 1367-1372 (2009)
	2008
10		Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire: Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. European Test Symposium 2008: 47-52
9		Stéphane Grauby, M. Amine Salhi, Luis David Patiño Lopez, Wilfrid Claeys, Benoît Charlot, Stefan Dilhaire: Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues. Microelectronics Reliability 48(2): 204-211 (2008)
	2006
8		Jean-Michel Rampnoux, H. Michel, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys, Stefan Dilhaire: Time gating imaging through thick silicon substrate: a new step towards backside characterisation. Microelectronics Reliability 46(9-11): 1520-1524 (2006)
	2005
7		Stéphane Grauby, M. Amine Salhi, Wilfrid Claeys, D. Trias, Stefan Dilhaire: ElectroStatic Discharge Fault Localization by Laser Probing. Microelectronics Reliability 45(9-11): 1482-1486 (2005)
	2004
6		Stefan Dilhaire, Stéphane Grauby, S. Jorez, Wilfrid Claeys: Strain energy imaging of a power MOS transistor using speckle interferometry. IEEE Transactions on Reliability 53(2): 293-296 (2004)
5		Luis David Patiño Lopez, Stéphane Grauby, Stefan Dilhaire, M. Amine Salhi, Wilfrid Claeys, Stéphane Lefèvre, Sebastian Volz: Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope. Microelectronics Journal 35(10): 797-803 (2004)
4		Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys, Jean-Christophe Batsale: Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy. Microelectronics Journal 35(10): 811-816 (2004)
3		Josep Altet, Jean-Michel Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby: Applications of temperature phase measurements to IC testing. Microelectronics Reliability 44(1): 95-103 (2004)
	2003
2		Stefan Dilhaire, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys: Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods. Microelectronics Reliability 43(9-11): 1609-1613 (2003)
1		G. Andriamonje, Vincent Pouget, Y. Ousten, Dean Lewis, Y. Danto, Jean-Michel Rampnoux, Y. Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys: Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectronics Reliability 43(9-11): 1803-1807 (2003)

Coauthor Index

1	Eduardo Aldrete-Vidrio	[10]
2	Josep Altet	[3] [10]
3	G. Andriamonje	[1]
4	Jean-Christophe Batsale	[3] [4]
5	Benoît Charlot	[9]
6	Wilfrid Claeys	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11]
7	L. Clerjaud	[10]
8	Yves Danto (Y. Danto)	[1]
9	Stefan Dilhaire	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11]
10	Y. Ezzahri	[1]
11	S. Jorez	[6]
12	Stéphane Lefèvre	[5]
13	Dean Lewis	[1]
14	Luis David Patiño Lopez	[5] [9] [11]
15	Diego Mateo	[10]
16	H. Michel	[8] [10]
17	Y. Ousten (Yves Ousten)	[1]
18	Vincent Pouget	[1]
19	Etienne Puyoo	[11]
20	Jean-Michel Rampnoux	[1] [3] [8] [10] [11]
21	Antonio Rubio	[3] [10]
22	M. Amine Salhi	[2] [5] [7] [8] [9] [10] [11]
23	D. Trias	[7]
24	Sebastian Volz	[5]

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