Tibor Grasser

	2012
18		Tibor Grasser: Stochastic charge trapping in oxides: From random telegraph noise to bias temperature instabilities. Microelectronics Reliability 52(1): 39-70 (2012)
	2011
17		Stanislav Tyaginov, Ivan Starkov, Hubert Enichlmair, C. Jungemann, J. M. Park, E. Seebacher, R. L. de Orio, Hajdin Ceric, Tibor Grasser: An analytical approach for physical modeling of hot-carrier induced degradation. Microelectronics Reliability 51(9-11): 1525-1529 (2011)
16		Gregor Pobegen, Thomas Aichinger, Tibor Grasser, Michael Nelhiebel: Impact of gate poly doping and oxide thickness on the N- and PBTI in MOSFETs. Microelectronics Reliability 51(9-11): 1530-1534 (2011)
	2010
15		K. Rupp, Ansgar Jüngel, Tibor Grasser: Matrix compression for spherical harmonics expansions of the Boltzmann transport equation for semiconductors. J. Comput. Physics 229(23): 8750-8765 (2010)
14		Stanislav Tyaginov, Ivan Starkov, Oliver Triebl, Johann Cervenka, C. Jungemann, S. Carniello, J. M. Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, E. Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser: Interface traps density-of-states as a vital component for hot-carrier degradation modeling. Microelectronics Reliability 50(9-11): 1267-1272 (2010)
	2009
13		M. Vasicek, Viktor Sverdlov, Johann Cervenka, Tibor Grasser, Hans Kosina, Siegfried Selberherr: Transport in Nanostructures: A Comparative Analysis Using Monte Carlo Simulation, the Spherical Harmonic Method, and Higher Moments Models. LSSC 2009: 443-450
12		Ph. Hehenberger, P.-J. Wagner, H. Reisinger, Tibor Grasser: On the temperature and voltage dependence of short-term negative bias temperature stress. Microelectronics Reliability 49(9-11): 1013-1017 (2009)
11		Stanislav Tyaginov, Viktor Sverdlov, Ivan Starkov, Wolfgang Gös, Tibor Grasser: Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage rate. Microelectronics Reliability 49(9-11): 998-1002 (2009)
	2008
10		Thomas Aichinger, Michael Nelhiebel, Tibor Grasser: On the temperature dependence of NBTI recovery. Microelectronics Reliability 48(8-9): 1178-1184 (2008)
	2007
9		Michael Spevak, Tibor Grasser: Discretization of Macroscopic Transport Equations on Non-Cartesian Coordinate Systems. IEEE Trans. on CAD of Integrated Circuits and Systems 26(8): 1408-1416 (2007)
8		Stefan Holzer, Alireza Sheikholeslami, Markus Karner, Tibor Grasser, Siegfried Selberherr: Comparison of deposition models for a TEOS LPCVD process. Microelectronics Reliability 47(4-5): 623-625 (2007)
7		Robert Entner, Tibor Grasser, Oliver Triebl, Hubert Enichlmair, Rainer Minixhofer: Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures. Microelectronics Reliability 47(4-5): 697-699 (2007)
6		Markus Karner, Andreas Gehring, M. Wagner, R. Entner, Stefan Holzer, Wolfgang Gös, M. Vasicek, Tibor Grasser, Hans Kosina, Siegfried Selberherr: VSP - A gate stack analyzer. Microelectronics Reliability 47(4-5): 704-708 (2007)
5		Tibor Grasser, Siegfried Selberherr: Editorial. Microelectronics Reliability 47(6): 839-840 (2007)
	2006
4		Johann Cervenka, W. Wessner, E. Al-Ani, Tibor Grasser, Siegfried Selberherr: Generation of Unstructured Meshes for Process and Device Simulation by Means of Partial Differential Equations. IEEE Trans. on CAD of Integrated Circuits and Systems 25(10): 2118-2128 (2006)
	2005
3		Stephan Wagner, Tibor Grasser, Claus Fischer, Siegfried Selberherr: An advanced equation assembly module. Eng. Comput. (Lond.) 21(2): 151-163 (2005)
	2004
2		Stefan Holzer, Rainer Minixhofer, Clemens Heitzinger, Johannes Fellner, Tibor Grasser, Siegfried Selberherr: Extraction of material parameters based on inverse modeling of three-dimensional interconnect fusing structures. Microelectronics Journal 35(10): 805-810 (2004)
	2003
1		T. Ayalew, Andreas Gehring, J. M. Park, Tibor Grasser, Siegfried Selberherr: Improving SiC lateral DMOSFET reliability under high field stress. Microelectronics Reliability 43(9-11): 1889-1894 (2003)

Coauthor Index

1	Thomas Aichinger	[10] [16]
2	E. Al-Ani	[4]
3	T. Ayalew	[1]
4	S. Carniello	[14]
5	Hajdin Ceric	[14] [17]
6	Johann Cervenka	[4] [13] [14]
7	Hubert Enichlmair	[7] [14] [17]
8	R. Entner	[6]
9	Robert Entner	[7]
10	Johannes Fellner	[2]
11	Claus Fischer	[3]
12	Andreas Gehring	[1] [6]
13	Wolfgang Gös	[6] [11]
14	Ph. Hehenberger	[12]
15	Clemens Heitzinger	[2]
16	Stefan Holzer	[2] [6] [8]
17	Ansgar Jüngel	[15]
18	C. Jungemann	[14] [17]
19	Markus Karner	[6] [8] [14]
20	Ch. Kernstock	[14]
21	Hans Kosina	[6] [13]
22	Rainer Minixhofer	[2] [7] [14]
23	Michael Nelhiebel	[10] [16]
24	R. L. de Orio	[17]
25	J. M. Park	[1] [14] [17]
26	Gregor Pobegen	[16]
27	H. Reisinger	[12]
28	K. Rupp	[15]
29	E. Seebacher	[14] [17]
30	Siegfried Selberherr	[1] [2] [3] [4] [5] [6] [8] [13]
31	Alireza Sheikholeslami	[8]
32	Michael Spevak	[9]
33	Ivan Starkov	[11] [14] [17]
34	Viktor Sverdlov	[11] [13]
35	Oliver Triebl	[7] [14]
36	Stanislav Tyaginov	[11] [14] [17]
37	M. Vasicek	[6] [13]
38	M. Wagner	[6]
39	P.-J. Wagner	[12]
40	Stephan Wagner	[3]
41	W. Wessner	[4]

Colors in the list of coauthors

Last update Wed May 30 22:34:44 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page