Kristian Granhaug

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2008

4 Kristian Granhaug, Snorre Aunet: Improving Yield and Defect Tolerance in Subthreshold CMOS Through Output-Wired Redundancy. J. Electronic Testing 24(1-3): 157-163 (2008)

2006

3 Kristian Granhaug, Snorre Aunet: Six Subthreshold Full Adder Cells Characterized in 90 nm CMOS Technology. DDECS 2006: 27-32

2 Kristian Granhaug, Snorre Aunet: Improving Yield and Defect Tolerance in Multifunction Subthreshold CMOS Gates. DFT 2006: 20-28

1 Kristian Granhaug, Snorre Aunet, Tor Sverre Lande: Body-bias regulator for ultra low power multifunction CMOS gates. ISCAS 2006

	2008
4		Kristian Granhaug, Snorre Aunet: Improving Yield and Defect Tolerance in Subthreshold CMOS Through Output-Wired Redundancy. J. Electronic Testing 24(1-3): 157-163 (2008)
	2006
3		Kristian Granhaug, Snorre Aunet: Six Subthreshold Full Adder Cells Characterized in 90 nm CMOS Technology. DDECS 2006: 27-32
2		Kristian Granhaug, Snorre Aunet: Improving Yield and Defect Tolerance in Multifunction Subthreshold CMOS Gates. DFT 2006: 20-28
1		Kristian Granhaug, Snorre Aunet, Tor Sverre Lande: Body-bias regulator for ultra low power multifunction CMOS gates. ISCAS 2006

Coauthor Index

1 Snorre Aunet [1] [2] [3] [4]

2 Tor Sverre Lande [1]

Last update Wed May 30 22:34:44 2012 CET by the DBLP Team —

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