Matt Grady

	2006
3		Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh: Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction. IEEE Design & Test of Computers 23(2): 110-116 (2006)
	2002
2		Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh: Redundancy Implications for Early-Life Reliability: Experimental Verification of an Integrated Yield-Reliability Model. ITC 2002: 693-699
1		Thomas S. Barnett, Adit D. Singh, Matt Grady, Kathleen G. Purdy: Yield-Reliability Modeling: Experimental Verification and Application to Burn-In Reduction. VTS 2002: 75-80

Coauthor Index

1	Thomas S. Barnett	[1] [2] [3]
2	Kathleen G. Purdy	[1] [2] [3]
3	Adit D. Singh	[1] [2] [3]

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