M. Grützner

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2005

1 M. Grützner: Advanced electrical analysis of embedded memory cells using atomic force probing. Microelectronics Reliability 45(9-11): 1509-1513 (2005)

	2005
1		M. Grützner: Advanced electrical analysis of embedded memory cells using atomic force probing. Microelectronics Reliability 45(9-11): 1509-1513 (2005)

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