 | 2010 |
|---|
| 11 |       | Michele Portolan,
Bradford G. Van Treuren,
Suresh Goyal:
Scan chain securization though Open-Circuit Deadlocks.
ITC 2010: 808 |
| 10 | | Kyoung Joon Kim,
Francesco Cottone,
Suresh Goyal,
Jeff M. Punch:
Energy scavenging for energy efficiency in networks and applications.
Bell Labs Technical Journal 15(2): 7-29 (2010) |
| 9 | | Michele Portolan,
Suresh Goyal,
Bradford G. Van Treuren,
Chen-Huan Chiang,
Tapan J. Chakraborty,
Thomas B. Cook:
A Common Language Framework for Next-Generation Embedded Testing.
IEEE Design & Test of Computers 27(5): 36-49 (2010) |
| 2009 |
|---|
| 8 | | Michele Portolan,
Suresh Goyal,
Bradford G. Van Treuren:
Scalable and efficient integrated test architecture.
ITC 2009: 1 |
| 2008 |
|---|
| 7 | | Michele Portolan,
Suresh Goyal,
Bradford G. Van Treuren,
Chen-Huan Chiang,
Tapan J. Chakraborty,
Thomas B. Cook:
A New Language Approach for IJTAG.
ITC 2008: 1-10 |
| 6 | | Moutaz Khouja,
Suresh Goyal:
A review of the joint replenishment problem literature: 1989-2005.
European Journal of Operational Research 186(1): 1-16 (2008) |
| 2007 |
|---|
| 5 | | Simon P. Wilson,
Ben Flood,
Suresh Goyal,
Jim Mosher,
Susan Bergin,
Joseph O'Brien,
Robert Kennedy:
Parameter Estimation for a Model with Both Imperfect Test and Repair.
VTS 2007: 271-276 |
| 4 | | Eric S. Fisher,
Steven Fortune,
Martin K. Gladstein,
Suresh Goyal,
William B. Lyons,
James H. Mosher Jr.,
Gordon T. Wilfong:
Economic modeling of global test strategy I: Mathematical models.
Bell Labs Technical Journal 12(1): 161-173 (2007) |
| 3 | | Eric S. Fisher,
Steven Fortune,
Martin K. Gladstein,
Suresh Goyal,
William B. Lyons,
James H. Mosher Jr.,
Gordon T. Wilfong:
Economic modeling of global test strategy II: Software system and examples.
Bell Labs Technical Journal 12(1): 175-186 (2007) |
| 2006 |
|---|
| 2 | | Suresh Goyal,
James H. Mosher Jr.:
An improved test process model for cost reduction.
Bell Labs Technical Journal 11(1): 173-190 (2006) |
| 1 | | Toby Joyce,
Edward J. Lisay,
David E. Dalton,
Jeff M. Punch,
Michael S. Shellmer,
Shirish N. Kher,
Suresh Goyal:
Piecewise analysis and modeling of circuit pack temperature cycling data.
Bell Labs Technical Journal 11(3): 21-37 (2006) |
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