 | 2009 |
|---|
| 9 |       | S. Kook,
Hyun Choi,
Vishwanath Natarajan,
Abhijit Chatterjee,
Alfred V. Gomes,
Shalabh Goyal,
Le Jin:
Low Cost Dynamic Test Methodology for High Precision ΣD ADCs.
Asian Test Symposium 2009: 69-74 |
| 8 | | S. Kook,
Vishwanath Natarajan,
Abhijit Chatterjee,
Shalabh Goyal,
Le Jin:
Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation.
European Test Symposium 2009: 3-8 |
| 2008 |
|---|
| 7 | | Shalabh Goyal,
Abhijit Chatterjee:
Linearity Testing of A/D Converters Using Selective Code Measurement.
J. Electronic Testing 24(6): 567-576 (2008) |
| 2007 |
|---|
| 6 | | Shalabh Goyal,
Abhijit Chatterjee,
Michael Purtell:
A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters.
J. Electronic Testing 23(1): 95-106 (2007) |
| 2006 |
|---|
| 5 | | Shalabh Goyal,
Abhijit Chatterjee,
Mike Atia:
Reducing Sampling Clock Jitter to Improve SNR Measurement of A/D Converters in Production Test.
European Test Symposium 2006: 165-172 |
| 4 | | Donghoon Han,
Shalabh Goyal,
Soumendu Bhattacharya,
Abhijit Chatterjee:
Low Cost Parametric Failure Diagnosis of RF Transceivers.
European Test Symposium 2006: 205-212 |
| 2005 |
|---|
| 3 | | Shalabh Goyal,
Michael Purtell:
Alternate Test Methodology for High Speed A/D Converter Testing on Low Cost Tester.
Asian Test Symposium 2005: 14-17 |
| 2 | | Shalabh Goyal,
Abhijit Chatterjee,
Mike Atia,
Howard Iglehart,
Chung Yu Chen,
Bassem Shenouda,
Nash Khouzam,
Hosam Haggag:
Test time reduction of successive approximation register A/D converter by selective code measurement.
ITC 2005: 8 |
| 2004 |
|---|
| 1 | | Ganesh Srinivasan,
Shalabh Goyal,
Abhijit Chatterjee:
Reconfiguration for Enhanced ALternate Test (REALTest) of Analog Circuits.
Asian Test Symposium 2004: 302-307 |
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