J. L. Goudard

	2005
5		S. Huyghe, L. Béchou, N. Zerounian, Y. Deshayes, F. Aniel, A. Denolle, D. Laffitte, J. L. Goudard, Y. Danto: Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier. Microelectronics Reliability 45(9-11): 1593-1599 (2005)
	2003
4		Y. Deshayes, L. Béchou, J.-Y. Delétage, F. Verdier, Y. Danto, D. Laffitte, J. L. Goudard: Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules. Microelectronics Reliability 43(7): 1125-1136 (2003)
3		L. Mendizabal, Jean-Louis Verneuil, L. Béchou, Christelle Aupetit-Berthelemot, Y. Deshayes, F. Verdier, Jean-Michel Dumas, Y. Danto, D. Laffitte, J. L. Goudard: Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator. Microelectronics Reliability 43(9-11): 1743-1749 (2003)
2		J. L. Goudard, X. Boddaert, J. Périnet, D. Laffitte: Reliability of optoelectronics components: towards new qualification practices. Microelectronics Reliability 43(9-11): 1767-1769 (2003)
	2002
1		J. L. Goudard, P. Berthier, X. Boddaert, D. Laffitte, J. Périnet: New qualification approach for optoelectronic components. Microelectronics Reliability 42(9-11): 1307-1310 (2002)

Coauthor Index

1	F. Aniel	[5]
2	Christelle Aupetit-Berthelemot	[3]
3	L. Béchou (Laurent Béchou)	[3] [4] [5]
4	P. Berthier	[1]
5	X. Boddaert	[1] [2]
6	Yves Danto (Y. Danto)	[3] [4] [5]
7	J.-Y. Delétage	[4]
8	A. Denolle	[5]
9	Y. Deshayes	[3] [4] [5]
10	Jean-Michel Dumas	[3]
11	S. Huyghe	[5]
12	D. Laffitte	[1] [2] [3] [4] [5]
13	L. Mendizabal	[3]
14	J. Périnet	[1] [2]
15	F. Verdier	[3] [4]
16	Jean-Louis Verneuil	[3]
17	N. Zerounian	[5]

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