H. D. B. Gottlob

	2005
1		M. C. Lemme, J. K. Efavi, H. D. B. Gottlob, T. Mollenhauer, T. Wahlbrink, H. Kurz: Comparison of metal gate electrodes on MOCVD HfO2. Microelectronics Reliability 45(5-6): 953-956 (2005)

Coauthor Index

1	J. K. Efavi	[1]
2	H. Kurz	[1]
3	M. C. Lemme	[1]
4	T. Mollenhauer	[1]
5	T. Wahlbrink	[1]

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