Harald Gossner

	2010
13		Harald Gossner, Werner Simbürger, Matthias Stecher: System ESD robustness by co-design of on-chip and on-board protection measures. Microelectronics Reliability 50(9-11): 1359-1366 (2010)
	2009
12		Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix: Reliability aspects of gate oxide under ESD pulse stress. Microelectronics Reliability 49(12): 1407-1416 (2009)
11		Wolfgang Stadler, Tilo Brodbeck, Reinhold Gärtner, Harald Gossner: Do ESD fails in systems correlate with IC ESD robustness? Microelectronics Reliability 49(9-11): 1079-1085 (2009)
	2007
10		Wolfgang Soldner, Martin Streibl, U. Hodel, Marc Tiebout, Harald Gossner, Doris Schmitt-Landsiedel, Jung-Hoon Chun, Choshu Ito, Robert W. Dutton: RF ESD protection strategies: Codesign vs. low-C protection. Microelectronics Reliability 47(7): 1008-1015 (2007)
	2005
9		Martin Streibl, F. Zängl, Kai Esmark, Robert Schwencker, Wolfgang Stadler, Harald Gossner, S. Drüen, Doris Schmitt-Landsiedel: High abstraction level permutational ESD concept analysis. Microelectronics Reliability 45(2): 313-321 (2005)
8		Heinrich Wolf, Horst A. Gieser, Wolfgang Soldner, Harald Gossner: A Dedicated TLP Set-Up to Investigate the ESD Robustness of RF Elements and Circuits. Microelectronics Reliability 45(9-11): 1421-1424 (2005)
	2004
7		Harald Gossner: ESD protection for the deep sub micron regime - a challenge for design methodology. VLSI Design 2004: 809-
	2003
6		Martin Streibl, Kai Esmark, A. Sieck, Wolfgang Stadler, M. Wendel, J. Szatkowski, Harald Gossner: Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies. Microelectronics Reliability 43(7): 1001-1010 (2003)
	2002
5		Wolfgang Stadler, Kai Esmark, Harald Gossner, Martin Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, Erich Gornik: Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development. Microelectronics Reliability 42(9-11): 1267-1274 (2002)
4		F. Zängl, Harald Gossner, Kai Esmark, R. Owen, G. Zimmermann: Case study of a technology transfer causing ESD problems. Microelectronics Reliability 42(9-11): 1275-1280 (2002)
	2001
3		Kai Esmark, Wolfgang Stadler, M. Wendel, Harald Gossner, X. Guggenmos, Wolfgang Fichtner: Advanced 2D/3D ESD device simulation - a powerful tool already used in a pre-Si phase. Microelectronics Reliability 41(11): 1761-1770 (2001)
2		Harald Gossner, T. Müller-Lynch, Kai Esmark, Matthias Stecher: Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology. Microelectronics Reliability 41(3): 385-393 (2001)
1		Martin Litzenberger, R. Pichler, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Kai Esmark, Harald Gossner: Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices. Microelectronics Reliability 41(9-10): 1385-1390 (2001)

Coauthor Index

1	David Alvarez	[12]
2	Alain Bravaix	[12]
3	Tilo Brodbeck	[11] [12]
4	Sergey Bychikhin (Scrgey Bychikhin)	[1]
5	Kiran V. Chatty	[12]
6	Jung-Hoon Chun	[10]
7	S. Drüen	[9]
8	Robert W. Dutton	[10]
9	Kai Esmark	[1] [2] [3] [4] [5] [6] [9] [12]
10	Wolfgang Fichtner	[3] [5]
11	Reinhold Gaertner (Reinhold Gärtner)	[11]
12	Robert Gauthier	[12]
13	Horst A. Gieser	[8]
14	Erich Gornik	[1] [5]
15	X. Guggenmos	[3]
16	U. Hodel	[10]
17	Adrien Ille	[12]
18	Choshu Ito	[10]
19	Martin Litzenberger	[1] [5]
20	T. Müller-Lynch	[2]
21	R. Owen	[4]
22	R. Pichler	[1]
23	Dionyz Pogany	[1] [5]
24	Thomas Pompl	[12]
25	Philipp Riess	[12]
26	Doris Schmitt-Landsiedel	[9] [10]
27	Robert Schwencker	[9]
28	A. Sieck	[6]
29	Werner Simbürger	[13]
30	Wolfgang Soldner	[8] [10]
31	Wolfgang Stadler	[3] [5] [6] [9] [11] [12]
32	Matthias Stecher	[2] [13]
33	Martin Streibl	[5] [6] [9] [10]
34	J. Szatkowski	[6]
35	Marc Tiebout	[10]
36	M. Wendel	[3] [5] [6]
37	Heinrich Wolf	[8]
38	F. Zängl	[4] [9]
39	G. Zimmermann	[4]

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