Patrick Gorria

	2012
14		Youssef Bokhabrine, Ralph Seulin, Lew Fock Chong Lew Yan Voon, Patrick Gorria, Gouenou Girardin, Miguel Gomez, Daniel Jobard: 3D characterization of hot metallic shells during industrial forging. Mach. Vis. Appl. 23(3): 417-425 (2012)
	2007
13		Molinier Thierry, David Fofi, Patrick Gorria, Joaquim Salvi: Automatic texture mapping on real 3D model. CVPR 2007
	2006
12		Olivier Morel, Mathias Ferraton, Christophe Stolz, Patrick Gorria: Active Lighting Applied to Shape from Polarization. ICIP 2006: 2181-2184
	2004
11		Pierrick Bourgeat, Fabrice Meriaudeau, Patrick Gorria, Kenneth W. Tobin, Frédéric Truchetet: Features extraction on complex images. ICIP 2004: 219-222
10		Pierrick Bourgeat, Fabrice Meriaudeau, Kenneth W. Tobin, Patrick Gorria: Content based segmentation of patterned wafers. J. Electronic Imaging 13(3): 428-435 (2004)
9		Olivier Aubreton, Benaissa Bellach, Lew Fock Chong Lew Yan Voon, Bernard Lamalle, Patrick Gorria, Guy Cathébras: Retina for pattern matching in standard 0.6-µm complementary metal oxide semiconductor technology. J. Electronic Imaging 13(3): 559-569 (2004)
	2002
8		Khalil Maalmi, A. El-Ouaazizi, Rachid Benslimane, Lew Fock Chong Lew Yan Voon, A. Diou, Patrick Gorria: Detecting parabolas in ultrasound B-scan images with Genetic-Based Inverse Voting Hough Transform. ICASSP 2002: 3337-3340
7		Khalil Maalmi, A. El-Ouaazizi, Rachid Benslimane, Lew Fock Chong Lew Yan Voon, A. Diou, Patrick Gorria: Crack Defect Detection and Localization Using Genetic-Based Inverse Voting Hough Transform. ICPR (3) 2002: 257-260
6		Ralph Seulin, Fred Merienne, Patrick Gorria: Simulation of Specular Surface Imaging Based on Computer Graphics: Application on a Vision Inspection System. EURASIP J. Adv. Sig. Proc. 2002(7): 649-658 (2002)
5		Denis Aluze, Fred Merienne, Christophe Dumont, Patrick Gorria: Vision system for defect imaging, detection, and characterization on a specular surface of a 3D object. Image Vision Comput. 20(8): 569-580 (2002)
	2001
4		E. Fauvet, Lew Fock Chong Lew Yan Voon, Fred Nicolier, Patrick Gorria, Frédéric Truchetet: Optimizing the Factorisation of 2D Filters by Genetic Algorithm. VIIP 2001: 676-681
3		Gaëtan Delcroix, Ralph Seulin, Bernard Lamalle, Patrick Gorria, Fred Merienne: Study of the imaging conditions and processing for the aspect control of specular surfaces. J. Electronic Imaging 10(1): 196-202 (2001)
2		Anne-Claire Legrand, Pierre Suzeau, Eric Renier, Frédéric Truchetet, Patrick Gorria, Fabrice Meriaudeau: Machine vision systems in the metallurgy industry. J. Electronic Imaging 10(1): 274-282 (2001)
	2000
1		Anne-Claire Legrand, Patrick Gorria, Fabrice Meriaudeau: Active infrared nondestructive testing for glue occlusion detection in plastic cap. KES 2000: 381-384

Coauthor Index

1	Denis Aluze	[5]
2	Olivier Aubreton	[9]
3	Benaissa Bellach	[9]
4	Rachid Benslimane	[7] [8]
5	Youssef Bokhabrine	[14]
6	Pierrick Bourgeat	[10] [11]
7	Guy Cathébras	[9]
8	Gaëtan Delcroix	[3]
9	A. Diou	[7] [8]
10	Christophe Dumont	[5]
11	A. El-Ouaazizi	[7] [8]
12	E. Fauvet	[4]
13	Mathias Ferraton	[12]
14	David Fofi	[13]
15	Gouenou Girardin	[14]
16	Miguel Gomez	[14]
17	Daniel Jobard	[14]
18	Bernard Lamalle	[3] [9]
19	Anne-Claire Legrand	[1] [2]
20	Khalil Maalmi	[7] [8]
21	Fabrice Meriaudeau	[1] [2] [10] [11]
22	Frédéric Merienne (Fred Merienne)	[3] [5] [6]
23	Frédéric Morain-Nicolier (Frédéric Nicolier, Fred Nicolier)	[4]
24	Olivier Morel	[12]
25	Eric Renier	[2]
26	Joaquim Salvi	[13]
27	Ralph Seulin	[3] [6] [14]
28	Christophe Stolz	[12]
29	Pierre Suzeau	[2]
30	Molinier Thierry	[13]
31	Kenneth W. Tobin	[10] [11]
32	Frédéric Truchetet	[2] [4] [11]
33	Lew Fock Chong Lew Yan Voon	[4] [7] [8] [9] [14]

Last update Thu May 31 18:55:10 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page