Erich Gornik

	2011
15		Dionyz Pogany, Sergey Bychikhin, Michael Heer, W. Mamanee, Erich Gornik: Application of transient interferometric mapping method for ESD and latch-up analysis. Microelectronics Reliability 51(9-11): 1592-1596 (2011)
	2010
14		A. Podgaynaya, R. Rudolf, B. Elattari, Dionyz Pogany, Erich Gornik, Matthias Stecher, M. Strasser: Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization. Microelectronics Reliability 50(9-11): 1347-1351 (2010)
	2009
13		Michael Heer, Krzysztof Domanski, Kai Esmark, Ulrich Glaser, Dionyz Pogany, Erich Gornik, Wolfgang Stadler: Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology. Microelectronics Reliability 49(12): 1455-1464 (2009)
12		G. Haberfehlner, Sergey Bychikhin, V. Dubec, Michael Heer, A. Podgaynaya, M. Pfost, Matthias Stecher, Erich Gornik, Dionyz Pogany: Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. Microelectronics Reliability 49(9-11): 1346-1351 (2009)
	2007
11		V. Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Tilo Brodbeck, Wolfgang Stadler: Backside interferometric methods for localization of ESD-induced leakage current and metal shorts. Microelectronics Reliability 47(9-11): 1539-1544 (2007)
	2006
10		Michael Heer, V. Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, M. Frank, A. Konrad, J. Schulz: Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up. Microelectronics Reliability 46(9-11): 1591-1596 (2006)
	2005
9		Martin Litzenberger, Christoph Furböck, Sergey Bychikhin, Dionyz Pogany, Erich Gornik: Scanning heterodyne interferometer setup for the time-resolved thermal and free-carrier mapping in semiconductor devices. IEEE T. Instrumentation and Measurement 54(6): 2438-2445 (2005)
8		Michael Heer, V. Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, M. Denison, Matthias Stecher, G. Groos: Automated setup for thermal imaging and electrical degradation study of power DMOS devices. Microelectronics Reliability 45(9-11): 1688-1693 (2005)
	2003
7		M. Blaho, Dionyz Pogany, Erich Gornik, M. Denison, G. Groos, Matthias Stecher: Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method. Microelectronics Reliability 43(4): 545-548 (2003)
6		V. Dubec, Sergey Bychikhin, M. Blaho, Dionyz Pogany, Erich Gornik, J. Willemen, N. Qu, Wolfgang Wilkening, L. Zullino, A. Andreini: A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress. Microelectronics Reliability 43(9-11): 1557-1561 (2003)
	2002
5		Wolfgang Stadler, Kai Esmark, Harald Gossner, Martin Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, Erich Gornik: Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development. Microelectronics Reliability 42(9-11): 1267-1274 (2002)
4		M. Blaho, Dionyz Pogany, L. Zullino, A. Andreini, Erich Gornik: Experimental and simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions. Microelectronics Reliability 42(9-11): 1281-1286 (2002)
3		Dionyz Pogany, J. Kuzmik, J. Darmo, Martin Litzenberger, Sergey Bychikhin, Karl Unterrainer, Z. Mozolova, S. Hascik, Tibor Lalinsky, Erich Gornik: Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters using backside infrared OBIC technique. Microelectronics Reliability 42(9-11): 1673-1677 (2002)
	2001
2		Martin Litzenberger, R. Pichler, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Kai Esmark, Harald Gossner: Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices. Microelectronics Reliability 41(9-10): 1385-1390 (2001)
1		Sergey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, Erich Gornik, G. Groos, Matthias Stecher: Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. Microelectronics Reliability 41(9-10): 1501-1506 (2001)

Coauthor Index

1	A. Andreini	[4] [6]
2	M. Blaho	[4] [6] [7] [8]
3	Tilo Brodbeck	[11]
4	Sergey Bychikhin (Scrgey Bychikhin)	[1] [2] [3] [6] [8] [9] [10] [11] [12] [15]
5	J. Darmo	[3]
6	M. Denison	[7] [8]
7	Krzysztof Domanski	[13]
8	V. Dubec	[6] [8] [10] [11] [12]
9	B. Elattari	[14]
10	Kai Esmark	[2] [5] [13]
11	Wolfgang Fichtner	[5]
12	M. Frank	[10]
13	Christoph Furböck	[9]
14	Ulrich Glaser	[13]
15	Harald Gossner	[2] [5]
16	G. Groos	[1] [7] [8]
17	G. Haberfehlner	[12]
18	S. Hascik	[3]
19	Michael Heer	[8] [10] [12] [13] [15]
20	A. Konrad	[10]
21	J. Kuzmik	[3]
22	Tibor Lalinsky	[3]
23	Martin Litzenberger	[1] [2] [3] [5] [9]
24	W. Mamanee	[15]
25	Z. Mozolova	[3]
26	M. Pfost	[12]
27	R. Pichler	[1] [2]
28	A. Podgaynaya	[12] [14]
29	Dionyz Pogany	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15]
30	N. Qu	[6]
31	R. Rudolf	[14]
32	J. Schulz	[10]
33	Wolfgang Stadler	[5] [11] [13]
34	Matthias Stecher	[1] [7] [8] [12] [14]
35	M. Strasser	[14]
36	Martin Streibl	[5]
37	Karl Unterrainer	[3]
38	M. Wendel	[5]
39	Wolfgang Wilkening	[6]
40	J. Willemen	[6]
41	L. Zullino	[4] [6]

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