 | 2011 |
| 15 |  | Alberto González-Sanchez,
Rui Abreu,
Hans-Gerhard Groß,
Arjan J. C. van Gemund:
Spectrum-Based Sequential Diagnosis.
AAAI 2011 |
| 14 |  | Alberto González-Sanchez,
Rui Abreu,
Hans-Gerhard Gross,
Arjan J. C. van Gemund:
Prioritizing tests for fault localization through ambiguity group reduction.
ASE 2011: 83-92 |
| 13 |  | Alberto González-Sanchez:
Cost Optimizations in Runtime Testing and Diagnosis of Systems of Systems.
ICST 2011: 439-442 |
| 12 |  | Rui Abreu,
Alberto González-Sanchez,
Arjan J. C. van Gemund:
A Diagnostic Reasoning Approach to Defect Prediction.
IEA/AIE (2) 2011: 416-425 |
| 11 |  | Alberto González-Sanchez,
Rui Abreu,
Hans-Gerhard Groß,
Arjan J. C. van Gemund:
An empirical study on the usage of testability information to fault localization in software.
SAC 2011: 1398-1403 |
| 10 |  | Éric Piel,
Alberto González-Sanchez,
Hans-Gerhard Groß,
Arjan J. C. van Gemund:
Spectrum-Based Health Monitoring for Self-Adaptive Systems.
SASO 2011: 99-108 |
| 9 |  | Alberto González-Sanchez,
Éric Piel,
Rui Abreu,
Hans-Gerhard Groß,
Arjan J. C. van Gemund:
Prioritizing tests for software fault diagnosis.
Softw., Pract. Exper. 41(10): 1105-1129 (2011) |
| 2010 |
| 8 |  | Alberto González-Sanchez,
Éric Piel,
Hans-Gerhard Groß,
Arjan J. C. van Gemund:
Minimising the Preparation Cost of Runtime Testing Based on Testability Metrics.
COMPSAC 2010: 419-424 |
| 7 |  | Éric Piel,
Alberto González-Sanchez,
Hans-Gerhard Groß:
Built-In Data-Flow Integration Testing in Large-Scale Component-Based Systems.
ICTSS 2010: 79-94 |
| 6 |  | Rui Abreu,
Alberto González-Sanchez,
Arjan J. C. van Gemund:
Exploiting count spectra for Bayesian fault localization.
PROMISE 2010: 12 |
| 5 |  | Alberto González-Sanchez,
Éric Piel,
Hans-Gerhard Groß,
Arjan J. C. van Gemund:
Prioritizing Tests for Software Fault Localization.
QSIC 2010: 42-51 |
| 4 |  | Éric Piel,
Alberto González-Sanchez,
Hans-Gerhard Groß:
Automating Integration Testing of Large-Scale Publish/Subscribe Systems.
Principles and Applications of Distributed Event-Based Systems 2010: 140-163 |
| 2009 |
| 3 |  | Juan Frausto Solís,
Alberto González-Sanchez,
Monica Larre:
A New Method for Optimal Cropping Pattern.
MICAI 2009: 566-577 |
| 2 |  | Alberto González-Sanchez,
Éric Piel,
Hans-Gerhard Groß:
RiTMO: A Method for Runtime Testability Measurement and Optimisation.
QSIC 2009: 377-382 |
| 2008 |
| 1 |  | Rui Abreu,
Alberto González-Sanchez,
Peter Zoeteweij,
Arjan J. C. van Gemund:
On the Performance of Fault Screeners in Software Development and Deployment.
ENASE 2008: 123-130 |