Tomás González

	2001
1		Javier Mateos, Tomás González, Daniel Pardo, Virginie Hoel, Alain Cappy: Monte Carlo simulation of electronic characteristics in short channel delta-doped AlInAs/GaInAs HEMTs. Microelectronics Reliability 41(1): 73-77 (2001)

Coauthor Index

1	Alain Cappy	[1]
2	Virginie Hoel	[1]
3	Javier Mateos	[1]
4	Daniel Pardo	[1]

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