T. González

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2001

1 M. J. Martín-Martínez, S. Pérez, D. Pardo, T. González: High injection effects on noise characteristics of Si BJTs and SiGe HBTs. Microelectronics Reliability 41(6): 847-854 (2001)

	2001
1		M. J. Martín-Martínez, S. Pérez, D. Pardo, T. González: High injection effects on noise characteristics of Si BJTs and SiGe HBTs. Microelectronics Reliability 41(6): 847-854 (2001)

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