Fernando M. Gonçalves

	2009
24		E. Albuquerque, Vasco Bexiga, R. Bugalho, B. Carriço, C. S. Ferreira, Manuel Ferreira, J. Godinho, Fernando M. Gonçalves, Carlos Leong, Pedro Lousã, Pedro Machado, R. Moura, Pedro Neves, C. Ortigão, Fernando Piedade, J. F. Pinheiro, P. Relvas, A. Rivetti, Pedro Rodrigues, J. C. Silva, M. M. Silva, Isabel C. Teixeira, João Paulo Teixeira, Andreia Trindade, João Varela: On-Detector Electronics of the Clear PEM Scanner. BIODEVICES 2009: 355-358
	2005
23		Victor Gonçalves, José T. de Sousa, Fernando M. Gonçalves: A Low-Cost Scalable Pipelined Reconfigurable Architecture for Simulation of Digital Circuits. FPL 2005: 481-486
	2003
22		Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Property Coverage for Quality Assessment of Fault Tolerant or Fail Safe Systems. IOLTS 2003: 164-165
	2002
21		Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Self-Checking and Fault Tolerance Quality Assessment Using Fault Sampling. DFT 2002: 216-224
20		José T. de Sousa, Fernando M. Gonçalves, Nuno Barreiro, João Moura: DARP - A Digital Audio Reconfigurable Processor. FPL 2002: 556-566
19		Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage. J. Electronic Testing 18(2): 179-187 (2002)
18		Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Design and Test of a Certifiable ASIC for a Safety-Critical Gas Burner Control System. J. Electronic Testing 18(3): 285-294 (2002)
	2001
17		Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Design and Test of Certifiable ASICs for Safety-Critical Gas Burners Contro. IOLTW 2001: 197-201
16		Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Implicit functionality and multiple branch coverage (IFMB): a testability metric for RT-level. ITC 2001: 377-385
15		Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems. J. Electronic Testing 17(3-4): 311-319 (2001)
	1999
14		Fernando M. Gonçalves, João Paulo Teixeira: Teaching Microelectronic-Based Integrated Systems Design and Test. MSE 1999: 65-66
13		Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Defect-Oriented Verilog Fault Simulation of SoC Macros using a Stratified Fault Sampling Technique. VTS 1999: 326-332
12		Fernando M. Gonçalves, João Paulo Teixeira: Defect-Oriented Sampling of Non-Equally Probable Faults in VLSI Systems. J. Electronic Testing 15(1-2): 41-52 (1999)
	1998
11		Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Defect-oriented test quality assessment using fault sampling and simulation. ITC 1998: 35-42
10		Fernando M. Gonçalves, João Paulo Teixeira: Sampling Techniques of Non-Equally Probable Faults in VLSI System. VTS 1998: 283-288
	1997
9		Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Realistic Fault Extraction for High-Quality Design and Test of VLSI Systems. DFT 1997: 29-37
	1996
8		José T. de Sousa, Fernando M. Gonçalves, João Paulo Teixeira, Cristoforo Marzocca, Francesco Corsi, Thomas W. Williams: Defect level evaluation in an IC design environment. IEEE Trans. on CAD of Integrated Circuits and Systems 15(10): 1286-1293 (1996)
	1994
7		Antonio Casimiro, Fernando M. Gonçalves, João Paulo Teixeira, Marcelino B. Santos: On the Analysis of Routing Cells and Adjacency Faults in CMOS Digital Circuits. DFT 1994: 263-270
6		José T. de Sousa, Fernando M. Gonçalves, João Paulo Teixeira, Thomas W. Williams: Fault Modeling and Defect Level Projections in Digital ICs. EDAC-ETC-EUROASIC 1994: 436-442
5		M. Calha, Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Back Annotation of Physical Defects into Gate-Level, Realistic Faults in Digital ICs. ITC 1994: 720-728
	1992
4		M. Saraiva, P. Casimiro, Marcelino B. Santos, José T. de Sousa, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Physical DFT for High Coverage of Realistic Faults. ITC 1992: 642-651
	1991
3		José T. de Sousa, Fernando M. Gonçalves, João Paulo Teixeira: IC Defects-Based Testability Analysis. ITC 1991: 500-509
2		João Paulo Teixeira, Isabel C. Teixeira, C. F. Beltrá Almeida, Fernando M. Gonçalves, J. Gonçalves: A methodology for testability enhancement at layout level. J. Electronic Testing 1(4): 287-299 (1991)
	1990
1		João Paulo Teixeira, Isabel C. Teixeira, C. F. Beltrá Almeida, Fernando M. Gonçalves, J. Gonçalves, R. Crespo: A strategy for testability enhancement at layout level. EURO-DAC 1990: 413-417

Coauthor Index

1	E. Albuquerque	[24]
2	C. F. Beltrá Almeida	[1] [2]
3	Nuno Barreiro	[20]
4	Vasco Bexiga	[24]
5	R. Bugalho	[24]
6	M. Calha	[5]
7	B. Carriço	[24]
8	Antonio Casimiro	[7]
9	P. Casimiro	[4]
10	Francesco Corsi	[8]
11	R. Crespo	[1]
12	C. S. Ferreira	[24]
13	Manuel Ferreira	[24]
14	J. Godinho	[24]
15	J. Gonçalves	[1] [2]
16	Victor Gonçalves	[23]
17	Carlos Leong	[24]
18	Pedro Lousã	[24]
19	Pedro Machado	[24]
20	Cristoforo Marzocca	[8]
21	R. Moura	[24]
22	João Moura	[20]
23	Pedro Neves (Pedro Miguel Neves)	[24]
24	C. Ortigão	[24]
25	Fernando Piedade	[24]
26	J. F. Pinheiro	[24]
27	P. Relvas	[24]
28	A. Rivetti	[24]
29	Pedro Rodrigues	[24]
30	Marcelino B. Santos (Marcelino Bicho Dos Santos)	[4] [5] [7] [11] [13] [15] [16] [17] [18] [19] [21] [22]
31	M. Saraiva	[4]
32	J. C. Silva	[24]
33	M. M. Silva	[24]
34	José T. de Sousa	[3] [4] [6] [8] [20] [23]
35	Isabel C. Teixeira (Isabel Maria Cacho Teixeira)	[1] [2] [4] [5] [9] [11] [13] [15] [16] [17] [18] [19] [21] [22] [24]
36	João Paulo Teixeira	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [21] [22] [24]
37	Andreia Trindade	[24]
38	João Varela	[24]
39	Thomas W. Williams	[6] [8]

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