S. Gomri

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2005

1 D. Goguenheim, A. Bravaix, S. Gomri, J. M. Moragues, C. Monserie, N. Legrand, P. Boivin: Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies. Microelectronics Reliability 45(3-4): 487-492 (2005)

	2005
1		D. Goguenheim, A. Bravaix, S. Gomri, J. M. Moragues, C. Monserie, N. Legrand, P. Boivin: Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies. Microelectronics Reliability 45(3-4): 487-492 (2005)

Coauthor Index

Last update Wed May 30 22:34:44 2012 CET by the DBLP Team —

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1	P. Boivin	[1]
2	A. Bravaix	[1]
3	Didier Goguenheim (D. Goguenheim)	[1]
4	N. Legrand	[1]
5	C. Monserie	[1]
6	J. M. Moragues	[1]