Y. V. Gomeniuk

	2007
1		Y. V. Gomeniuk, A. N. Nazarov, Ya. N. Vovk, V. S. Lysenko, Yi Lu, Octavian Buiu, Steve Hall, R. J. Potter, P. Chalker: Charge trapping and interface states in hydrogen annealed HfO2-Si structures. Microelectronics Reliability 47(4-5): 714-717 (2007)

Coauthor Index

1	Octavian Buiu	[1]
2	P. Chalker	[1]
3	Steve Hall	[1]
4	Yi Lu	[1]
5	V. S. Lysenko	[1]
6	A. N. Nazarov	[1]
7	R. J. Potter	[1]
8	Ya. N. Vovk	[1]

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