N. Tosic Golo

	2002
2		N. Tosic Golo, Fred G. Kuper, Ton J. Mouthaan: Zapping thin film transistors. Microelectronics Reliability 42(4-5): 747-765 (2002)
	2001
1		N. Tosic Golo, S. van der Wal, Fred G. Kuper, Ton J. Mouthaan: The time-voltage trade-off for ESD damage threshold in amorphous silicon hydrogenated thin-film transistors. Microelectronics Reliability 41(9-10): 1391-1396 (2001)

Coauthor Index

1	Fred G. Kuper	[1] [2]
2	Ton J. Mouthaan	[1] [2]
3	S. van der Wal	[1]

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