| | |
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 | 1986 | |
|---|---|---|
| 9 |      | Prabhakar Goel, Chi-Lai Huang, Robert E. Blauth: Application of Parallel Processing to Fault Simulation. ICPP 1986: 785-788 |
| 1985 | ||
| 8 | | Prabhakar Goel, Chi-Lai Huang: Statistical Fault Sampling and Full Fault Simulation. ITC 1985: 801-802 |
| 1984 | ||
| 7 | | Prabhakar Goel: Testability Analysis will not Replace Fault Simulation. ITC 1984: 722-724 |
| 1982 | ||
| 6 |  | Prabhakar Goel, M. T. McMahon: Electronic Chip-in-Place Test. DAC 1982: 482-488 |
| 5 | | Sumit DasGupta, Prabhakar Goel, Ron G. Walther, Tom W. Williams: A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI. ITC 1982: 63-66 |
| 4 | | Prabhakar Goel, M. T. McMahon: Electronic Chip-In-Place Test. ITC 1982: 83-91 |
| 1981 | ||
| 3 | | Prabhakar Goel, Barry C. Rosales: PODEM-X: An automatic test generation system for VLSI logic structures. DAC 1981: 260-268 |
| 2 | | Prabhakar Goel: An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits. IEEE Trans. Computers 30(3): 215-222 (1981) |
| 1980 | ||
| 1 | | Prabhakar Goel: Test generation costs analysis and projections. DAC 1980: 77-84 |
| 1 | Robert E. Blauth | [9] |
| 2 | Sumit DasGupta | [5] |
| 3 | Chi-Lai Huang | [8] [9] |
| 4 | M. T. McMahon | [4] [6] |
| 5 | Barry C. Rosales | [3] |
| 6 | Ron G. Walther | [5] |
| 7 | Tom W. Williams | [5] |
Colors in the list of coauthors
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